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Using high-speed digitizers for Test and Measurement applications

Why do customers use Agilent’s Hi-speed data-convertors for Test & Measurement?

Whatever the application, whether it’s in Research & Education, Commercial & Industrial, or in the Aerospace & Defense world, customers use Agilent’s high-speed data-converters because of at least one of the following benefits:

  • Small Size
  • Low Power Consumption
  • Higher Measurement Throughput
  • Better Measurement Fidelity
  • Lower Total Cost of Ownership

Customers will use a cross section of different products depending on their platform, PCI, PXI, cPCI and VME, to fully integrated multichannel systems.

Research & Education Market

Customers who are principally using the high-speed data-converters for research & educational purposes typically need at least of the following:

  • Greater channel density, to provide more measurement in a smaller footprint. Multiple channels across multiple modules can also be synchronized using the Acqiris ASBus system.
  • Higher measurement throughput allowing higher trigger rate, and less missed measurable events.
  • Fewer measurements to obtain the correct result, higher precision, more accurate results.
  • Faster integration, software support for multiple O/S and programming environments, with application, code examples and turnkey software.

Typical applications areas include: Nuclear Physics, Particle Physics, HEP, Hydrodynamic Tests, Astrophysics, Plasma Research

Commercial & Industrial Market

Customers in the commercial & industrial world who principally use the high-speed data-converters for in-house test and measurement purposes (including ATE) typically need at least one of the following:

  • Greater channel density, to provide more measurement in a smaller footprint.
  • Higher measurement throughput, providing higher test throughput. In ATE this can also reduce production costs (E.g. a test system that operates twice as fast replaces two slower systems).
  • Fewer measurements to obtain the correct result, means less measurements required and faster testing.
  • Faster time-to-market, software support for multiple O/S and programming environments, with application code examples and turnkey demo software.
  • Real-time on-board signal processing.

Applications include calibration, development, ATE production and functional tests for Semiconductor Devices, Laser Printer Heads, Hard Disk Drives, Telecommunication Infrastructure, Automotive Components, Medical Systems

Aerospace & Defense Market

Aerospace & Defense customers who principally use the high-speed data-converters for ATE and other T&M equipment typically need at least one of the following:

  • Greater channel density to provide more measurement in a smaller footprint.
  • Higher measurement throughput means higher test throughput.
  • Fewer measurements to obtain the correct result.
  • Faster time-to-market.

Applications include development and ATE from O-level to Depot for Radar systems (including microwave guidance systems - seekers), Electronic Warfare (SIGINT systems), Electro-optical systems (LIDAR)

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