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[Method of Implementation] MIPI M-PHY TxRx Interface S-parameter and Impedance Test

Overview

This method of implementation (MOI) is intended to provide the measurement procedures for the interface S-parameter and impedance tests defined in the MIPI Alliance Specification for M-PHY. The MOI and test package work with Agilent E5071C ENA Option TDR for efficient measurements.

Revision Number

Rev.1.00

Measurement Parameters

  • M-TX S-PARAMETERS AND IMPEDANCE
    • M-TX Differential Return Loss
    • M-TX Common-Mode Return Loss
    • Single-Ended Output Resistance
    • HS-TX Single-Ended Output Resistance Mismatch
    • Single-Ended Output Resistance, STALL or SLEEP State
  • M-RX S-PARAMETERS AND IMPEDANCE
    • M-RX Differential Return Loss
    • M-RX Differential Termination Resistance

 

Measurement Image
 

Documents et téléchargements

Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Notes d’application 2011-12-01

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E5071C-TDR Test Package for MIPI M-PHY Tx/Rx Devices 
This package includes the E5071C-TDR state files and vba macro software that support the measurements described in the MOI.

Exemple de programmation 2011-12-01

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