Does Agilent i3070 automatically generate a boundary scan test for Self monitoring cell?
Yes, If there were a Self monitoring cell on a device pin that did not connect to another Boundary Scan device pin, there will still be silicon node declared in the generated interconnect test. In this case, the Boundary-Scan driver and receiver happen to be the same device and pin.
In the 'fault-dictionary' type information at the end of the 3070 interconnect VCL or in the ".x" file, there is terminology such as 'Monitor PO', where this self-monitoring structure exists.
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