Is the IEEE Standard 1149.1 supported on the Agilent Medalist i3070 series of ICT systems?
Yes the Agilent Medalist i3070 series of in-circuit testers supports testing of the IEEE Standard 1149.1 boundary scan. In fact, the Agilent Medalist i3070 was among the first ICT systems to support the IEEE Standard 1149.1 when it was first released as a standard in 1990.
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