On-Wafer Test of Power Devices

On-Wafer Test of Power Devices

Reduce your Development Time for Power Devices with On-Wafer Test

On-wafer test of your power devices can increase your rate of product introduction to meet the needs of your customers. With on-wafer test you can speed your turnaround in the design, development and characterization of your new power devices.

Cascade Microtech’s Tesla on-wafer power device characterization system is a complete on-wafer test solution. The Tesla system is designed to provide probing levels of up to 3,000 V, 100 A and 100 W/cm2.

It features an advanced chuck mechanism to ensure low contact resistance, facilitate thin wafer handling and power dissipation while providing a low-noise, fully guarded and shielded test environment. Tesla uses the Agilent B1505A power device analyzer/curve tracer to make the necessary measurements. This single box solution allows accurate measurement and curve tracing for the key parameters of interest when characterizing a power semiconductor device.

The combination of the Agilent B1505A and Cascade Microtech’s Tesla system provides the capabilities you need in a system designed specifically for power devices. With the Tesla system you can migrate your characterization from in-package to on-wafer test, optimize your development process and, as a result, reduce the product development time for your power devices.

• On-wafer test of power devices
• Reduce the development time for power devices
• Supports probing at up to 3,000 V, 100 A and 100 W/cm2
• Light curtain and interlocks for operator safety
• Advanced chuck mechanism for low contact resistance and low noise
• Uses Agilent B1505A power device analyzer/curve tracer

Request more information and Agilent’s partner, Cascade Microtech will contact you to discuss your requirements in more detail.