Automated Test / Board Test User Groups

Content From October 11, 2007 Santa Clara Board Test Users Group meeting

General Session:

• Dynamic Assembly is a “Perfect Storm” – Bruce Isbell, Valor
• Economic Justification of Test Equipment - Kerry Brown, Agilent Technologies, Inc.
• NEMI Economic Model
• Gain Critical Insight From Data You Already Have - Nader Fathi, Sigmaquest

In-Circuit Test Break-out Session:

• Practical Debugging and Testing BGA - David Kim, Paramit
• Top10_Reasons_I_Don't_Want_To_Upgrade_to_A_PC - Doug Olson and Bill Conde, Agilent Technologies, Inc
• Bead Probe Cad Strategy for ICT - Don DeMille, DeMille Research Inc.
• Board Flex Analysis - Neil Adams, Circuit Check
• 1149.6 Overview - Doug Olson, Agilent Technologies, Inc.
• Fixture Resource Overflow Using Advanced Boundary Scan - Bill Bischoff, Testing House
• VTEP_iVTEP_VTEP2_Best_Practice_Discussion - Doug Olson, Agilent Technologies, Inc

Automated X-ray Inspection Break-out Session:

• Attendees received content via email

Automated Optical Inspection Break-out Session:

• Content available upon request