Is it possible to test non-boundary scan digital devices connected to boundary scan devices?
It is possible to test non-boundary scan digital devices that are connected to a boundary scan device. This test strategy is commonly known as Silicon Nail test where the boundary scan cell (driver/receiver) of the boundary scan device connected to the non boundary scan device pins will be able to simulate the operation of the non-boundary scan device.
It is important to note that the operation of the non-boundary scan device must be described using a library/model for the boundary scan software to generate the vectors needed to test the non-boundary scan device.
Figure 1: A non boundary scan device (U3) connected to a boundary scan chain (U1 & U2).
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