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S-Parameter Measurements on Multiport Devices

Reduce the time to measure the S-parameters of your high pin count multiport devices

The MPTS 388 automated test system from In-Phase Technologies utilizes a high pin count switching matrix to automatically configure S-parameter measurements for devices with up to 216 ports. When matched with an Agilent Technologies vector network analyzer the In-Phase MPTS 388 test system allows you to reduce dramatically the time to measure the S-parameters of your high pin count multiport microwave devices.

  • S-parameter measurements on high pin count multiport devices
  • Switching matrix allows automatic reconfiguration of connections
  • Test system handles high pin count devices with up to 216 ports
  • Works with Agilent PNA or PNA-X microwave network analyzer
  • Proprietary software for automated control
  • Software allows user-defined naming conventions
  • Reduces time to measure S-parameters on multiport devices
  • Request more information and Agilent’s partner, In-Phase, will contact you to discuss your requirements in more detail.

Documents & Downloads

S-Parameter Measurements on Multiport Devices 
Co-branded Solutions Partner brochure with In-Phase Technologies on S-parameter measurements on multiport devices

Brochure 2012-02-24

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