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Recommended Modeling Configurations for Device Modeling

Device Modeling using IC-CAP

The tables below contain recommended instrument configurations for device modeling using Agilent EEsof EDA's IC-CAP parameter extraction and device modeling software.

Each configuration includes a performance network analyzer (PNA) for the chosen frequency range and bias networks for combining the DC and RF signals and making standard Kelvin measurements. The DC-subsystem includes the Agilent 4156C or E5270B DC source/monitor for highly precision DC measurements.

Instrument and Hardware Details

 

In addition to the hardware listed above, refer to the information below on Agilent 11612T/V-Kxx High-Frequency Bias Networks.

Note: All of the Block Diagram and Setup files in the tables below consist of more than one Microsoft® PowerPoint slide. To advance or go back within the slide set, click with the left-hand mouse button on the arrows in the bottom left-hand corner of each slide. Material Lists are provided in Microsoft Excel or Word format.

Agilent 4156C Parameter Analyzer
Frequency Range Block Diagram and Setup Materials List
DC / CV   Block Diagram and Setup   Materials List
1/f Noise Measurement   Block Diagram and Setup   Materials List
0.045 - 20 GHz   Block Diagram and Setup   Materials List
0.045 - 20 GHz + CV   Block Diagram and Setup   Materials List
0.045 - 40 GHz   Block Diagram and Setup   Materials List
0.045 - 50 GHz   Block Diagram and Setup   Materials List
0.045 - 50 GHz + CV   Block Diagram and Setup   Materials List
0.045 - 67 GHz   Block Diagram and Setup   Materials List
0.01 - 110 GHz   Block Diagram and Setup   Materials List
Pulsed Device-Modeling Characterization See Pulsed Characterization section below. See Pulsed Characterization section below.
Agilent E5270B Parameter Analyzer
Frequency Range Block Diagram and Setup Materials List
DC / CV   Block Diagram and Setup   Materials List
1/f Noise Measurement --- ---
0.045 - 20 GHz   Block Diagram and Setup   Materials List
0.045 - 20 GHz + CV   Block Diagram and Setup   Materials List

0.045 - 40 GHz		   Block Diagram and Setup   Materials List
0.045 - 50 GHz   Block Diagram and Setup   Materials List
0.045 - 50 GHz + CV   Block Diagram and Setup   Materials List
0.045 - 67 GHz   Block Diagram and Setup   Materials List
0.01 - 110 GHz   Block Diagram and Setup   Materials List
Pulsed Device-Modeling Characterization See Pulsed Characterization section below. See Pulsed Characterization section below.

Pulsed Characterization

Agilent Technologies recommends Auriga Measurement Systems for integrated pulsed-characterization systems. Agilent IC-CAP Parameter Extraction and Device Modeling Software can be integrated with Auriga test systems. For more information, refer to Auriga Measurement Systems, LLC. 

The Auriga pulsed-bias/pulsed-RF solution replaces the discontinued Agilent 85124A Pulsed Modeling System.

For assistance, please contact Agilent EEsof EDA Technical Support.

Discontinuance of 8510-series Network Analyzers and Related Products

Agilent 8510-series network analyzers and the Agilent 85124P DC Pulser have been discontinued effective 31 October 2003. Device modeling configurations that use these instruments will continue to be supported for five years, until 1 November 2008.

For more information, click on the following links:

Related Products

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