In today’s era of networked, knowledge-based discovery, the best answers often come from the diverse perspectives of scientists and engineers working in multi-disciplinary teams pursuing research in biology, chemistry, informatics, medicine, physics and electronics. This can be especially true in nanotechnology where complementary skills are often needed to solve the toughest problems in research, development and commercialization.
|Technical Articles||Tuning the Cavity Modes of a Fabry–Perot Resonator using Gold Nanoparticles||Anirban Mitra, Hayk Harutyunyan, Stefano Palomba and Lukas Novotny, Optics Letters, Volume 35, No 7, 1 April 2010|
|Technical Articles||Extreme Design: Monitoring and Controlling Particle Beams in Real Time||Richard Soden, PlanetAnalog, April 2010|
|Research Collaborations||Agilent Technologies and Stanford University to Explore New Class of Nanoscale Devices||Agilent Press Release, 27 October 2009|
|Research Collaborations||High-Frequency Characterization and Modeling of Carbon Nanotube Based FETs||Chaitanya Kshirsagar, Hong Li, Thomas E. Kopley, Kaustav Banerjee, University of California, IEEE Electron Device Letters|
|Technical Articles||A Combined Experimental and Theoretical Study of the Generation of Palladium Clusters on Au(111) with a Scanning Tunnelling Microscope||M. G. Del Pópolo, E. P. M. Leiva, H. Kleine, J. Meier, U. Stimming, M. Mariscal and W. Schmickler, Electrochimica Acta, Volume 48, Issue 9, 20 April 2003, Pages 1287-1294|
|Technical Articles||Characterization of the Passivation Layer at the Polymer Electrolyte/Lithium Electrode Interface||Maryline Le Granvalet-Mancini, Tobias Hanrath and Dale Teeters, Solid State Ionics, Volume 135, Issues 1-4, 1 November 2000, Pages 283-290|
- Simultaneous Topography and Fluorescence Imaging of Cells
- Particle Characterization
- Measuring Substrate-Independent Young’s Modulus
- Using Instrumented Indentation to Measure the Complex Modulus of Highly Plasticized Polyvinyl Chloride
- Scratch Testing of Multi-Layered Metallic Film Stacks
- Stiffness Mapping: a Dynamic Imaging Technique
- The Agilent Advantage brochure
- Nano-mechanical application notes
- Agilent Technologies Announces University Research Grants
- Educator's Corner - Your Education Resources
If you would like to know more about any of the information above, contact us
Enroll in myAgilent
A personalized view into the information most relevant to you.
Register Your Product
Register your products for service notifications, firmware update alerts, application notes and more…
Why Buy Agilent
See how the Agilent Advantage adds value to your purchase.
Learn about Keysight
Agilent’s Electronic Measurement Group is becoming Keysight Technologies.