EUMW2009: in The Agilent Exhibit booth
EUMW2009: in The Agilent Exhibit booth
As Platinum sponsor of EUMW 2009, Agilent is one of most important player in the test and measurement market. We’ll be demonstrating products and services for Wireless Communication, Radar, RF technologies, high-frequency semiconductors, electromagnetics, commercial and military RF, microwave and mm-wave electronics and applications.
While at the show, be sure to visit us in Booth 539.
EXHIBIT HOURS have been scheduled to provide maximum interaction between conference attendees and exhibitor personnel:
Tuesday, 29 September .......... 09:30 to 17:30 hrs
Wednesday, 30 September ...... 09:30 to 17:30 hrs
Thursday, 1 October .............. 09:00 to 15:00 hrs
|Accurate Nonlinear Device Measurement and Simulation Utilizing X-Parameters* and the Latest Innovations in Nonlinear Vector Network Analysis : the Nonlinear Vector Network Analyzer (NVNA) based on the PNA-X measures nonlinear device characteristics providing accurate insight into the nonlinear behavior of active devices. Advanced Design System (ADS) uses measured X-parameters and generates X-parameters from simulation. Using X-parameters, we’ll show how to significantly reduce the design cycle, ensure more design wins, and lower the risk of implementation for design houses, component suppliers, and system integrators.Come learn what others in the industry are realizing through the use of the NVNA, ADS, and X-parameters.||Comprehensive Active-Device Test with PNA-X : The PNA-X microwave network analyzer can measure an amplifier's gain, gain compression, harmonics, IMD, and noise figure with one easy setup and without an external combiner or filters. A new calibration technique yields the industry's most accurate noise figure measurements. The PNA-X also has complete pulsed and balanced measurement capabilities.||4-Port mmWave measurements up to 0.5 THz : The PNA-X Network Analyzer combined with a four port mm-wave test set allows users to control the power at the port of a device at mmWave frequencies. In addition the system allows users to make true differential measurements at 50 GHz to 0.5 THz as well as pulsed measurements.||Accurate Characterization of Electromagnetic Properties of Materials : Agilent, the leader in Microwave Materials Measurements, innovates solutions for measuring electromagnetic properties of materials, from stealth materials to dielectric substrates. Come see our latest revision of 85071E Materials Measurement Software. New features include easy setup and measurement of multi-layered samples and an exclusive algorithm for calculating permeability of magnetic materials.|
|7/12GHz Differential Probe : Agilent's new 100 KHz to 7/12 GHz active differential probes make the measurement and troubleshooting of high-speed digital circuits easier. The probe with a spectrum analyzer, a network analyzer or a signal source analyzer allows users to measure jitter and step responses and S-parameters of components and signal paths on PC board assemblies.||20GHz ENA Network Analyzer: Agilent’s ENA Network Analyzer delivers new standards in speed, accuracy and versatility for network analysis.||New RF Handheld Tester for Installation and Maintenance : FieldFox RF Analyzer is the world's most integrated handheld cable and antenna tester with network analysis and spectrum analysis functions drastically improves your productivity of installation and maintenance.||Scanning Microwave Microscopy : Scanning Microwave Microscopy (SMM), a new Atomic Force Microscope mode for high spatial resolution of electromagnetic materials properties.|
|MMIC Design Flow using ADS: The complete front-to-back MMIC design flow in ADS 2009, including PDKs, DFM, Wireless Verification, and EM integration.||4G MIMO Antenna and PCB Design using Agilent Genesys: Agilent Genesys is used to model a 2 element patch antenna system and analyze beam forming performance, accounting for real PCB design constraints and parasitics. MIMO antenna systems are key elements of high throughput 4G systems. Proper design of antenna matching and antenna parasitics are critical to high performance, especially in beam forming applications.||TDD-LTE MIMO BER Solutions Using Agilent SystemVue: SystemVue 2009 used for simulation and HW measurement demonstrating architectural design capability and FPGA prototype verification for TDD-LTE MIMO systems. TDD-LTE has been adopted as the multiplexing format for LTE deployment in the China market. Agilent is the only supplier to offer coded BER solutions for TDD-LTE.||EM, Circuit and System Co-Design of 4G Wireless and A/D Applications: EMPro 2009, Momentum, and ADS 2009 applied to RFICs, MMICs, RF Modules, PCB boards, and signal integrity.|
|New Dual Core CPU Improves Speed and Adds Capabilities: MXA is faster with removable hardrive for secure facilities.Demo speed increases compared to 856x and removable hard drive.||Wideband Signal Generation and Analysis: Show 300MHz wideband signal generation and analysis and highlight pulse building and multitone waveform creation apps.||Ultra High Power at Microwave: Show unprecedented output power in a microwave signal generator.||Waveform Capture and Playback on PXB, Baseband Signal Generator: Demonstrate playback of long arb waveforms with fading for military radio stress testing.|
* "X-parameters" is a registered trademark of Agilent Technologies. The X-parameter format and underlying equations are open and documented. For more information click here.