Automated Test / Board Test User Groups
Content From September 12, 2007 Bead Probe Users Group meeting
Bead Probe Welcome – Andrew Tek, Agilent Technologies, Inc.
Bead Probe CAD Strategy for In-Circuit Test – Don deMille, DeMille Research, Inc.
Bead Probe Case Study - Jeff Burgess, Intel
Bead Probe Repair - Glen Leinbach, (Caber Contacts, LLC)
Bead Probe Solder Beads on uVIA and thinline traces – JJ Grealish, Intel
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