PCBA Test Awards

Award-winning milestones

PCBA Test Awards

Agilent strives to continually bring you innovative technologies that will benefit your PCBA test implementations.

Here are the award-winning milestones. Thanks for your constant support and feedback to help us improve our technologies through the years:-

   
Agilent Cover-Extend Technology - Winner for Test and Measurement World's 2009 Best in Test award  Winner for Test and Measurement World's 2009 Best in Test award
Agilent Cover-Extend Technology - Winner for Circuits Assembly NPI 2009 award  Winner for Circuits Assembly NPI 2009 award
Agilent Cover-Extend Technology - Winner of EM Asia  Innovation Awards 2009  Winner of EM Asia  Innovation Awards 2009
Agilent Cover-Extend Technology - Winner of SMT Vision Award 2008  Winner of SMT Vision Award 2008
Agilent Cover-Extend Technology - Winner of 3rd SMT China Vision Award (2008-2009)  Winner of 3rd SMT China Vision Award 2008-2009
Agilent Cover-Extend Technology - Winner of EDN Innovation Award 2008  Winner of EDN Innovation Award 2008
Agilent Cover-Extend technology - Winner of the 2008 APEX IPC Innovation Technology Center award  Winner of the 2008 APEX IPC Innovation Technology Center award
Agilent Medalist 5DX Automated X-Ray Inspection system - Finalist for Test and Measurement World's 2009 Test of Time award   
Agilent Medalist VTEP v2.0 with Network Parameter Measurement - Winner of EM Asia Innovation Award 2008 for Test Systems/Equipment category   Winner of EM Asia Innovation Award 2008 for Test Systems/Equipment category
 Agilent Medalist x6000
Automated X-Ray Inspection System - 2nd SMT China VISION Awards (Inspection & Testing) 
2nd SMT China VISION Awards
Agilent Medalist x6000 Automated 
X-Ray Inspection System - Test & Measurement World 2008 Best in Test® Awards Honorable Mention   
2008 Best in Test Awards Honorable Mention
Agilent Medalist iVTEP Technology - 2007 Test & Measurement World
Best in Test® Awards Honorable Mention   
2007 Test & Measurement World Best in Test® Awards Honorable Mention
Agilent Medalist Bead Probe Technology - 2007 EM Asia Innovation Awards   2007 EM Asia Innovation Awards
Agilent Medalist Bead Probe Technology - 2007 EE Times ACE Innovator of the Year Finalist (Dr Kenneth Parker)      
Agilent Medalist Bead Probe Technology - 2006 EDN Innovation Awards (Test & Measurement)   2006 EDN Innovation Awards
Agilent Medalist Bead Probe Technology - 2006 EDN Innovator of the Year Finalist (Dr Kenneth Parker)      
Agilent Printed Circuit Board Test and Inspection Solutions - 2003 Frost & Sullivan's Product Line Award       
Agilent 5DX Series 5000 Automated X-ray Inspection - 2003 Frost & Sullivan's Product of the Year      
Agilent Automated Test Equipment - 2001 Frost & Sullivan's Market Penetration Award    2001 Frost & Sullivan's Market Penetration Award
 Agilent SJ50 Automated Optical Inspection - 2001 SMT Visions Award (Best New Product Winner)   2001 SMT Visions Award
HP/Agilent Dynamic Test Access Suite - 1998 SMT Vision Award   1998 SMT Vision Award
HP/Agilent Polarity Check - 1995 SMT Vision Award  1995 SMT Vision Award
HP/Agilent Agilent 3070 Pay-per-use - 1994 SMT Vision Award   1994 SMT Vision Award
HP/Agilent Testjet Technology - 1994 Test & Measurement World Best in Test® Award Winner  1994 Test & Measurement World Best in Test Award Winner