Pulsed Measurement of IV Characteristics and RF Parameters

Pulsed Measurement of IV Characteristics and RF Parameters

Accelerate your design process with pulsed IV/RF measurements

The AU4750 from Auriga Microwave is a next generation pulsed IV/RF measurement system with a modular hardware design and open software architecture designed to meet the needs of the device modeling community. The system can measure DC-IV, pulsed-IV curves and pulsed S-parameters. With pulse widths as narrow as 200 nsec and duty cycles as low as .001%, the AU4750 is ideally suited for isothermal testing of devices subject to the effects of self-heating.

The AU4750 can deliver up to 200 V and 30 A, essential for designers working with high-power devices. For pulsed-RF measurement of two port small-signal scattering parameters, the AU4750 is interfaced to an Agilent PNA-X microwave network analyzer. The Agilent network analyzer is fully integrated with the AU4750. The PNA-X software controls the setup, calibration and measurement tasks while the AU4750 controls the timing and triggering used to coordinate the pulsed DC and S-parameters measurements.

With the speed and accuracy provided by Auriga Microwave’s AU4750 Pulsed IV/RF Measurement Systems you can simulate your components under real-life conditions allowing you to accelerate your design process and improve your time-to-market.

• Pulsed measurement of active device IV characteristics
• Expandable to pulsed measurement of S-parameters
• Provides up to 200V, 30A for high power active devices
• External pulser heads minimize signal degradation
• Used with Agilent PNA-X for pulsed RF measurements
• More accurate device modeling for improved simulation
• Accelerates your design process

Request more information and Agilent’s partner Auriga Microwave will contact you to discuss your requirements in more detail.