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Embedded systems developers face increasing pressure to deliver products with more features that consume less power and cost less. At the same time, the migration towards ASICs and embedded core processors has accelerated. The increasing level of integration has a secondary effect: visibility of internal bus signals and processor activity decreases as more functionality is added to each chip. These developments require new tools and debugging strategies to bridge the system integration and debug challenges introduced with increased design complexity.

This paper by John Marshall, Hewlett Packard Company, examines the issues concerning the use of embedded-core processors and discusses new test and debug strategies. These strategies enable embedded system developers to debug systems developed on the increasingly complex and compact devices found in today's market. Specific examples are given using the ARM7 TDMI processor.