Setting Up IC-CAP WaferPro For On-Wafer Measurements
Webcast - recorded | Where & When
Agilent Technologies has introduced a new automated characterization software Module for IC-CAP, called WaferPro, for efficient on-wafer measurements across temperature. This new module is based on the robust and efficient control of IC-CAP for DC/CV Analyzers, network analyzers, probers, switching matrixes, temperature chucks as well as the 4070, 4080 and 41000 series of Agilent Parametric Testers. WaferPro follows the known IC-CAP principle to provide ready-to-go solutions, together with an open user interface which allows the user to adapt it to their special requirements, be it measurement wise, or data evaluation wise.
This presentation will cover a detailed demonstration of WaferPro and a best practice.
Who should view this webcast?
On-Wafer Semiconductor Test Engineers
Where & When
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|Free||At Your PC||Enroll / view the recording of the June 22, 2011 live broadcast|
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Training & Event Materials
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.
Seminar Materials 2011-06-22
PDF 3.07 MB
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