N3231A IC-CAP User Training

Audience: Device modelers and anyone who needs to understand the use of IC-CAP for modeling.

This 3-day course will show students how to define measurements and data; use basic analysis tools in IC-CAP, including Parameter Extraction Language (PEL), built-in functions and extractions, simulation and optimization; how to automate modeling tasks with macros; and how to use other simulators with IC-CAP, such as the Advanced Design System. A measurement exercise will familiarize students with the steps involved in working with a measurement system.

What you will Learn

• Navigate though the IC-CAP user interface
• Drive measurement systems from IC-CAP to collect data
• Extract model parameters from the measured data
• Simulate the model and compare results to measured data
• Optimize model parameters to match measured results
• Read files in and out of IC-CAP
• Introduction of PEL (Parameter Extraction Language) to automate IC-CAP
• Import data from IC-CAP into the Advanced Design System
• Use Advanced Design System models and simulator for IC-CAP
• Learn how to use User-Defined Models with IC-CAP

Prerequisites

• Knowledge of measurement and modeling concepts and techniques

Outline

• DAY ONE
  • Modeling and IC-CAP Fundamentals
  • Hardware, Measurements, and Extractions
  • Simulation and Optimization
• DAY TWO
  • Introduction to PEL
  • Extraction Methods: BJT Example
  • Automated Extraction
• DAY THREE
  • The NMOS Model
  • The IC-CAP Studio Interface
  • Advanced Features
  • ADS and IC-CAP
  • Data Management and Data I/O in IC-CAP