Digital Webcast Series - Master the high-speed digital test challenge
Why this series is important:
In this presentation series, we will respond to some of the biggest challenges developers of embedded designs are facing today: the characterization of high-speed digital devices used in many popular serial bus interfaces, such as PCIe™2, USB, DisplayPort, HDMI, MIPI, or the characterization of forward clocked memory or CPU interfaces. The following webinars will address burning questions about compliance testing of next generation multi-gigabit interfaces and may provide the right answers to the test requirements of your new designs.
Who Should Attend:
R&D and test engineers who need to validate high-speed digital I/O interfaces in the semiconductor, computer, storage, consumer or communications industries.
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