Programming Static and Dynamic Data into a I2C EEPROM and Serial Flash on the 3070

Programmable memory devices have become commonplace on today’s printed circuit boards. In-system programming of small memory devices is now an important part of the printed circuit board testing process. This webcast describes programming techniques that can be used on Agilent’s i3070-series in-circuit testers. It will also explore a method to program I2C EEPROMs and Serial Flash with both static data and dynamic data and then will look at the required tests, testplan subroutines, and some utilities to help make the task easier.

Who should attend: 3070 Test Engineers