Fundamentals of testing RF amplifiers and high-power devices with RF VNA
1 Hour | Webcast - recorded | Where & When
Evaluating S-parameters and other CW stimulus responses is essential for characterising RF amplifiers. An RF vector network analyser (VNA) plays a critical role for this purpose, and proper understanding of its measurement methodologies is crucial. Especially, the S-parameter measurement by applying high-power signals is a hot topic which is gaining a lot of interest not only in amplifier test applications but also in other general RF devices that operate at high powers, such as antennas, passive components, and HF/UHF-band RFIDs.
This presentation describes fundamentals, practical methodologies, and tips for accurately measuring RF amplifiers with the RF VNA. The topics discussed include basic S-parameter measurements for extracting stability factors, P1dB measurements, high-power S-parameter measurements, harmonic distortion measurements, power leveling for the device's input/output signals, and more.
Who should attend?
Researchers, design engineers, and test engineers who need to measure:
- RF amplifiers (power amps, LNAs, MRI/NMR amps, high-gain amps, etc)
Other passive and active devices that need to be tested with high power (antennas, ceramic devices, SAW/RF MEMS devices, HF/UHF-band RFIDs, etc)
The presenter: Takuya Hirato
Takuya Hirato, product marketing engineer, Agilent Technologies.
Takuya is a product marketing engineer for Agilent Technologies’ component test division. He started his carrier in R&D of Agilent Technologies in 2001. Since 2007, he has been a product marketing engineer for Agilent ENA series network analyzers, as his role in application development of component test with the network analyzers.
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