Boundary Scan Test Methods for DDR Memories
Webcast - recorded | Where & When
In-circuit testing of DDR Memories has become increasingly difficult. This Webcast will discuss methods of DDR test development and debug. It will describe the challenges facing engineers writing these tests and offer some solutions. The Webcast will focus on Boundary Scan testing of DDR memories.
Who should attend: ICT Test Developers
Where & When
|Price||Date(s)||Location||For more information|
|At Your PC||View the recording of the May 18, 2010 WebEx presentation|
Prices shown are list prices and are subject to change without notice.
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