Мероприятия

Список предстоящих мероприятий Agilent в России

 

Компания Agilent Technologies принимает участие в многочисленных выставках и конференциях, а также организует бесплатные технические семинары для своих клиентов. Будем рады видеть Вас на наших  мероприятиях в числе наших гостей! 

 

Мероприятия
Название Описание Дата Место проведения Информация
Выставка СвязьЭкспокомм 2012
 		 24-я международная выставка телекоммуникационного оборудования, систем управления и информационных технологий и услуг связи «СвязьЭкспокомм-2012» пройдет с 14 по 17 мая в центральном выставочном комплексе Экспоцентр.
 		 с 14 по 17 мая

Москва


 

 On-line регистрация
Осциллография и цифровой анализ Будучи признанным мировым лидером в области производства контрольно-измерительного оборудования, в настоящее время Agilent также является самым быстрорастущим производителем осциллографов в мире. В 2011 году компания получила глобальную премию Frost & Sullivan в номинации Компания года за достижения на рынке осциллографов.
За последние три года был полностью обновлен парк осциллографов. Сейчас мы предлагаем 10 различных семейств осциллографов – от ручных и экономичных до широкополосных и высокопроизводительных. В апреле 2012 году компания представила первый в мире осциллограф эконом-класса с полосой пропускания 1 ГГц, обладающий функциональностью 5 приборов в одном, а инвестиции в разработку чипсета на основе фосфида индия позволили значительно расширить полосу пропускания осциллографов (до 63 ГГц) и в то же время сохранить самый низкий в отрасли уровень шумов и джиттера.		 24 мая

Москва

 

 On-line регистрация

 

Live web seminars
Название Описание Дата Место проведения Информация
Think Outside the Box: PC-based Oscilloscope Analysis Software

Ever wish you could do additional signal viewing, analysis and documentation tasks away from your scope and target system? With Agilent’s InfiniiView oscilloscope analysis software, now you can. Whether you own an Agilent, Tek, LeCroy or other brand of scope, this webinar will highlight technical capabilities found on newer PC-based oscilloscope analysis tools. All attendees will receive a free 14-day trial license for Agilent’s PC-based InfiniiView which supports file types from a variety of different scopes.

 29th May Online Click here
Accelerating USB 3.0 product development Super speed USB presents new set of challenges for designers and developers. Not only do you need the right tools, you also need tools that are easy to use, and do not stretch your company’s budget. Whether you are designing host, hub or device, electrical or protocol, Agilent Technologies offers a complete solution for both compliance and development. The resources you find here will provide you with an overview of USB design, understand the latest measurement techniques, and illustrate design and debug approaches. 30th May Online Click here
Optimise UE design for greater battery run-time This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption resulting from the complex interactions between hardware, firmware, operating system and applications. It will evaluate the benefits of test automation including the development of real-world UE usage scenarios to evaluate battery drain rates and battery run down times. With the right tools UE designers can test early and thoroughly, adjusting their design implementation for optimal battery performance bringing smaller, longer running, products to market more quickly and with fewer resources. 12th June Online Click here
802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA This web seminar illustrates how the Agilent 8990B Peak Power Analyzer can be used in the 802.11ac wireless LAN transmitter testing. We will show you how to obtain perform output power, CCDF, power added efficiency test, trigger delay measurement, and power ON/OFF ramp testing measurement. We will also briefly introduce our 8990B Peak Power Analyzer & U2020 X-series USB Peak and Average Power Sensors. 13th June Online Click here 
Moving to non-signaling manufacturing test for wireless devices As wireless devices rapidly evolve, more wireless bands and formats are being implemented on chipsets used in smart phones, tablets, and other wireless communication devices. Manufacturers are looking for cost-effective ways to test these complex devices while moving them quickly into volume manufacturing. Non-signaling test is widely accepted as the fastest, most cost-effective technique for testing current and next-generation wireless devices in manufacturing. This presentation discusses the requirements to effectively implement non-signaling test including: what is non-signaling test, chipset test capabilities, required test equipment capabilities as well as tools and techniques to maximize throughput with minimum effort. 13th June Online Click here
Nonlinear characterisation and modeling through pulsed IV/S-parameters Amplifier designers have been making use of modern transistor models since their first appearance in the mid-1970s. Models have allowed engineers to create advanced designs with first-pass success without the need for multiple prototypes and design iterations. Compact transistor models, based on measured IV and S-Parameters, allow designers to shift focus from transistor designs to circuit designs. Extracted from quasi-isothermal pulsed IV and pulsed S-Parameter data and validated with load pull characterisation, compact transistor models contain a reduced set of parameters.During this web seminar you will learn and see examples of the design flow from Pulsed IV and Pulsed S-Parameters to Compact Transistor Models. 14th June Online Click here
Simulating power transients and noise In this web seminar we will look how easy it is to create arbitrary power waveforms on modern programmable power supplies for simulating supply transients and noise. We will also look at the technology hurdles that limit the arbitrary waveform bandwidth on modern supplies. Finally we will look at low cost methods for simulating fast power supply transients and high frequency noise beyond the bandwidth limitations of modern power supplies. 21st June Online Click here 
The right scope probes deliver results In this web seminar we will present the key criteria for you to use when selecting scope probes. You will also learn the advantages and tradeoffs between probe types, like passive, high speed single ended and differential, High Voltage, Current, etc.... Also you will see some new probing innovations which can make your job easier. 27th June Online Click here 

Ссылки по теме