H7230A #200 i3070 Family Advanced Digital Training

Audience: Engineers and technicians responsible for developing advanced digital programs on the Agilent 3070 board test system.

What you will Learn

• Implement combinational testing on the Agilent 3070
• Simplify complex timing diagrams into easily understood and managed events.
• Write and debug custom test units
• Write and debug custom subroutines
• Use the Pattern Capture Format (PCF) programming language
• Write and debug digital cluster tests (several devices in one test)
• Write timing sets to replace VCL subroutines
• Program FlashRAM on the 3070
• Program Programmable Logic Devices on the 3070

Prerequisites

• Must have an Agilent or Medalist 3070 or i5000 system with Combinational test licensed (either i5000 Muxed or Unmuxed systems).
• Completion of the Agilent 3070 Family User Fundamentals Training (H7230A #100) or i5000 Basic User Classes I & II (H7230A #500 & 555)
• Digital debug experience and / or experience developing custom digital tests

Outline

• Introduction & Preview
• Review of digital test basics: Vector Control Language (VCL), assignment section, test vectors, test units, test subroutines, the initialize to statement, homingloops, repeat loops, compress / end compress, Cyclic Redundancy Counter (CRC), Pattern Capture · Format (PCF), etc.
• Write Digital Tests
  · Defining a test strategy
  · Setup-Only libraries
  · Digital Setup Editor
  · Write a test of a Reset Function
  · Convert a data sheet’s complex timing diagram into pseudo-test code, linear test code, test units and subroutines.
  · Turn-on and debug the tests written
  · Experiment with PushButton Debug’s advanced digital test tools
• Timing Sets
  · Learn to use timing sets
  · Convert a VCL subroutine into a timing set
  · Turn-on and debug, experiment with PushButton Debug
• Program and Test Non-Volatile memory devices – Flash RAM
  · Overview of how a Flash RAM is programmed on the 3070
  · Develop a test to program and verify the Flash device
  · Discuss the Sequential and Flash programming test techniques
  · Discuss and implement the Flash ISP test techniques
  · Experiment with PushButton Debug using the Flash IPS test.
  · Turn-on, program and debug a FlashRAM test
• Program and Test Programmable Logic Device with ISP tools
  · Overview of PLD programming on the 3070
  · Discuss the process of generating the required test format (SVF, STAPL, JBC, JTAG, etc.)
  · Discuss the programming of multiple PLDs in a chain
  · Develop, turn-on and debug a PLD ISP test
• Optional Module: Testing Analog Devices with Digital test tools
  · Use digital tests to test analog devices (e.g.: Op Amps) to improve throughput