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Electromagnetic Properties of Materials: Characterization at Microwave Frequencies and Beyond


From stealth materials to dielectric substrates, accurate characterization of their electromagnetic properties at microwave and mm-wave frequencies provide engineers with critical information needed for material and circuit design, modeling, research, manufacturing and quality control. Many measurement methods exist, but which to choose is often a mystery. This seminar will clear the air by providing an overview of measurement methods, with strengths, limitations and applications of each advantage.

Who should view this Webcast
Electrical Engineers and Technicians in working in microwave and mm-wave material and circuit design, modeling, research, manufacturing or quality control.

Giveaway
Registrants who completely fill out the feedback form by July 8 will be eligible to win one of two $75 Amazon.com gift certificates. Drawing only open to residents of the 50 United States and Canada (except Quebec).

地點與時間

  費用 日期 地點 詳細資訊  
  免費
At Your PC Enroll / View the recording of the April 8, 2009 broadcast  

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