Master High-Speed Digital Test Challenges and Get Ready for 40/100G Optical Networks
This page contains the registration links for BOTH the Digital and the Photonics Webcast series.
- Digital Webcast Series - Master the high-speed digital test challenge
Why this Digital series is important:
In this presentation series, we will respond to some of the biggest challenges developers of embedded designs are facing today: the characterization of high-speed digital devices used in many popular serial bus interfaces, such as PCIe™2, USB, DisplayPort, HDMI, MIPI, or the characterization of forward clocked memory or CPU interfaces. The following webinars will address burning questions about compliance testing of next generation multi-gigabit interfaces and may provide the right answers to the test requirements of your new designs.
Who Should Attend:
R&D and test engineers who need to validate high-speed digital I/O interfaces in the semiconductor, computer, storage, consumer or communications industries. Enroll / View ALL of the WebEX events in this Digital Series
- Photonics Webcast Series - Be Ready for 40/100G Optical Networks & Components
Why this Photonics series is important:
This series of presentations covers test requirements associated with the design of high-speed communication systems and components, or with advanced signal and modulation principles. We will discuss test approaches for transients of reconfigurable network elements, and measurement solutions for the polarization and dispersion behaviour of new component and network designs, as well as other topics relevant to preparing for the transition to the next-generation network.
Who Should Attend:
Engineers and scientists conducting research on advanced photonic components and on 40 to 100G designs. R&D and test engineers of optical component vendors, working on advanced optical components. Enroll / View ALL of the WebEX events in this Photonics Series
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| Photonics |
Microsecond Transient Optical Power Measurements |
March 10, 2010
8am Pacific / 11am Eastern / 5pm Berlin |
Register (WebEx) |
| Digital |
PCI Express® 3.0 Introduction & Key Design Challenges |
February 17, 2010
10:00 am Pacific |
Register/View (Techonline webcast) |
| Photonics |
Polarization Challenges in 40/100G Network Upgrades |
Jan 27, 2010
8am Pacific / 11am Eastern / 5pm Berlin |
Register/View Recording (WebEX) |
| Digital |
USB 2.0 Electrical and Protocol Testing using an Oscilloscope |
January 14, 2010
10:00 am Pacific |
Register/View (Techonline webcast) |
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----- recordings from 2009 ----- |
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| Digital |
Solving High-Speed DDR SI and Probing Challenges |
January 13, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
Ensuring Interoperability And Performance Of Your DDR Memory Subsystem |
April 7, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
USB 3.0 Superspeed PHY Testing Challenges: Verify your 5Gbps design to the specification |
April 15, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
Debugging and Characterization of Embedded PCI Express® Applications |
April 16, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
Serial ATA Revision 3.0 PHY Testing Challenges: Verify your 6Gbps design to the specification |
May 13, 2009 |
Register/View Recording (Techonline webcast) |
| Photonics |
Fast and Accurate Multi-Port PDL / IL Measurements |
May 28, 2009 |
Register/View Recording (WebEX) |
| Digital |
Virtual Probing with Real-time Oscilloscopes and Waveform Transformation and Simulation Software |
May 28, 2009
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Register/View Recording (Techonline webcast) |
| Digital |
Capture and Analysis of Pulsed RADAR Signals |
June 4, 2009
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Register/View Recording (Techonline webcast) |
| Digital |
New Scope Technology Accelerates FPGA Debug |
June 11, 2009 |
Register/View (Techonline webcast) |
| Digital |
Solving DigRFv4 Debug Challenges |
June 16, 2009 |
Register/View Recording (Techonline webcast) |
| Photonics |
Coherent Detection of Polarization Multiplexed Amplitude and Phase Modulated Optical Signals |
June 25, 2009 |
Register/View Recording (WebEx) |
| Digital |
How To Pass The Receiver Compliance Test For PCI Express® |
June 30, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
How to test DisplayPort sink devices |
July 2, 2009 |
Register/View Recording (WebEx) |
| Photonics |
Quality Rating of Optical Signals Using the Optical Constellation Diagram |
July 14, 2009 |
Register/View Recording (WebEx) |
| Digital |
Introduction to MIPI device test |
August 4, 2009 |
Register/View Recording (WebEx) |
| Digital |
Be ready for the next generation HDMI standard |
Sept 30, 2009 |
Register/View Recording (WebEx) |
| Digital |
Tips to debug DDR parametric and protocol measurement with MSO |
Oct 1, 2009 |
Register/View Recording (Techonline webcast) |
| Digital |
How to handle USB 3.0 physical layer test requirements |
Oct 28, 2009 |
Register/View Recording (WebEx) |
| Photonics |
How can Reliable Electro-Optical S-parameter Tests Improve your Optical Transmitter and Receiver Designs |
Nov 19, 2009 |
Register/View Recording (WebEx) |
| Digital |
How to handle characterization and compliance tests within forward clocking systems |
Dec 3, 2009 |
Register/View Recording (WebEx) |
The links below in the Related section provide overviews of each of the events listed above.
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