Digital and Photonics Webcast Series
Master High-Speed Digital Test Challenges and Get Ready for 40/100G Optical Networks
This page contains the recording links for BOTH the Digital and the Photonics Webcast series.
- Digital Webcast Series - Master the high-speed digital test challenge
Why this Digital series is important:
In this presentation series, we will respond to some of the biggest challenges developers of embedded designs are facing today: the characterization of high-speed digital devices used in many popular serial bus interfaces, such as PCIe™2, USB, DisplayPort, HDMI, MIPI, or the characterization of forward clocked memory or CPU interfaces. The following webinars will address burning questions about compliance testing of next generation multi-gigabit interfaces and may provide the right answers to the test requirements of your new designs.
Who Should Attend:
R&D and test engineers who need to validate high-speed digital I/O interfaces in the semiconductor, computer, storage, consumer or communications industries.
- Photonics Webcast Series - Be Ready for 40/100G Optical Networks & Components
Why this Photonics series is important:
This series of presentations covers test requirements associated with the design of high-speed communication systems and components, or with advanced signal and modulation principles. We will discuss test approaches for transients of reconfigurable network elements, and measurement solutions for the polarization and dispersion behaviour of new component and network designs, as well as other topics relevant to preparing for the transition to the next-generation network.
Who Should Attend:
Engineers and scientists conducting research on advanced photonic components and on 40 to 100G designs. R&D and test engineers of optical component vendors, working on advanced optical components.
|Digital||See the Future of Arbitrary Waveform Generators||March 1, 2011||Register/View recording|
|----- recordings from 2010 -----||----- recordings from 2010 -----|
|Digital||PCI Express® 3.0 Receiver Testing:How to Generate the Test Set-up and Calibrate the Stressed Eye||Oct 12, 2010||Register/View recording|
|Photonics||Microsecond Transient Optical Power Measurements||March 10, 2010||Register/View Recording|
|Photonics||Polarization Challenges in 40/100G Network Upgrades||Jan 27, 2010||Register/View Recording|
|----- recordings from 2009 -----||----- recordings from 2009 -----|
|Photonics||Fast and Accurate Multi-Port PDL / IL Measurements||May 28, 2009||Register/View Recording|
|Photonics||Coherent Detection of Polarization Multiplexed Amplitude and Phase Modulated Optical Signals||June 25, 2009||Register/View Recording|
|Digital||How to test DisplayPort sink devices||July 2, 2009||Register/View Recording|
|Photonics||Quality Rating of Optical Signals Using the Optical Constellation Diagram||July 14, 2009||Register/View Recording|
|Digital||Introduction to MIPI device test||August 4, 2009||Register/View Recording|
|Digital||Be ready for the next generation HDMI standard||Sept 30, 2009||Register/View Recording|
|Digital||How to handle USB 3.0 physical layer test requirements||Oct 28, 2009||Register/View Recording|
|Photonics||How can Reliable Electro-Optical S-parameter Tests Improve your Optical Transmitter and Receiver Designs||Nov 19, 2009||Register/View Recording|
|Digital||How to handle characterization and compliance tests within forward clocking systems||Dec 3, 2009||Register/View Recording|
The links below in the Related section provide overviews of each of the events listed above.
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