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Evénements Agilent en France

Bienvenue sur la page des événements auxquels Agilent participe en France.

 

Agilent Technologies participe en tant qu'exposant à de nombreux salons et colloques mais organise également des séminaires techniques gratuits dans de nombreux domaines. Cette liste sera remise à jour régulièrement.

 

Nom Description Lieu et Dates Information
Les journées test et mesure SIMTEC Ces expositions itinérantes sont le complément indispensable d'un réseau de vente.
Près de 300 visiteurs qualifiés par journée, et une moyenne de 60 exposants par ville.
Elles maintiennent le contact de nos adhérents avec leurs clients de province.

Toulouse, Brest, Grenoble, Ecole Polytechnique, Arcachon, Aix En Provence, Tours, Lille

 Cliquez ici
ADS Learning Week in France (Toulouse)

Participez à la formation ADS qui se déroulera près de chez vous à Toulouse du 3 au 7 juin 2013!

 Toulouse, 3-7 juin Cliquez ici
Journée Technique PXI L’association PXI-Group a le but de promouvoir les solutions PXI au travers de conférences techniques et expositions. Massy, 6 juin Cliquez ici
HSD Symposium 2013 France

This seminar will show you how to successfully navigate today’s high-speed technologies and the challenges of signal integrity, from early design to prototype validation, whilst ensuring compliant designs.

 4th - 13th June Cliquez ici

 

Webcasts
Name Description   Date & Time Information
Your LTE Devices Need to Pass Conformance Tests – Now What? Conformance Testing is required to verify that global products meet international standards to ensure interoperability. This paper provides an overview of the LTE conformance process and a detailed analysis of the LTE RF Test Requirements from conformance and pre-conformance test perspectives.  23rd May at 16:00 CET Click here 
Multi-antenna Array Measurements Using Digitizers The discussion will cover: calibrating a digitizer-based system for matched cross-channel magnitude and phase, using digital down-conversion for optimizing the system sensitivity at the required bandwidth, and algorithms used on the resulting complex signals necessary to achieve measurement results of cross-channel (between antennas) phase and gain. At the conclusion of the paper, a representative system configuration will be described with measurement results derived from the techniques presented. 
 		   29th May at 16:00 CET
 		 Click here 
USB 3.0 Physical Layer Test Challenges: Gen3 and beyond
 		 In this webcast we will provide a USB 3.0 industry update as well as cover the latest physical layer compliance testing requirements and challenges for USB 2.0 and USB 3.0. Also, the USB 3.0 specification now includes several Engineering Change Notices (ECNs). We will review those that impact physical layer testing like SSC limits, interference issues, channel definition changes and describe the test method changes that will be required to meet the new requirements.
 		 12th June at 16:00 CET Click here 
Innovations in EDA: Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA This webcast will explore two very different technology mixes for a handset PA Module, one is built around a CMOS PA core, while another is built around a GaAs PA core. Technology implications and design techniques will be discussed, and tradeoffs will be illustrated using unique aspects of the multi-technology flow in ADS. 13th June at 16:00 CET Click here 
MIMO Over the Air (OTA) Handset Performance and Testing This webcast will summarize the current test methods and results from the latest inter-lab / inter-technique test campaign being carried out by CTIA with a look towards the remaining work prior to release of new standards.   27th June at 16:00 CET Click here 
PCI Express® 3.0 Compliance – Successfully Navigating the Standard This presentation will provide you with an overview of the latest developments in the PCI Express 3.0 standard, including new methods for validating transmitter jitter, transmit de-emphasis and preshoot, equalization parameters, and the effects of de-embedding on PCI Express compliance measurements. We will also discuss key considerations for receiver jitter stress testing at both the component and system level. Lastly, this presentation will provide instruction on how to accelerate PCI Express 3.0 testing using a 26GHz high speed switch to multiplex your DUT signals into your test instrumentation.
 		   10th July at 16:00 CET Click here 

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