Scientific Nanoindentation e-Seminars (aka webcasts)

Agilent Technologies invites you to attend our new scientific e-Seminars series (webcasts) this spring. These exclusive one-hour live events will cover several leading-edge nanoindentation topics. Each webcast has a Q&A session in which all online attendees can directly query the presenters.

Register Here  for these live sessions.

“Oliver & Pharr: Nanoindentation History”

Date: February 15 @ 10:00 a.m. (ET)

Topic: Nanoindentation: Past, Present, and Future

Warren C. Oliver, Ph.D. (Nanomechanics, Inc.)
George M. Pharr, Ph.D. (University of Tennessee-Knoxville)

We will jointly present a brief history of nanoindentation. A summary of a few obvious applications that drove the development of the technique will be reviewed. Finally, some of the more unusual applications that have turned up will be discussed.

This duo’s landmark 1992 article in JMR ushered in the era of nanoindentation. According to Thomas Reuters Web of Knowledge, it is one of the most cited articles in all of material science (nearly 6,000 citations).

“Innovative Measurements of Polymers”

Date: March 2 @ 11:00 a.m. (ET)

Topic 1: Measuring Shear Modulus of Gelatin by Instrumented Indentation

Jennifer Hay (Agilent Technologies)

Instrumented indentation is a useful tool for measuring the shear modulus of polymers. In this seminar, a new procedure is presented for testing gelatinous materials. Potential problems such as surface detection, material transfer, and constraint effect are addressed. This procedure may help illuminate the relationship between mechanical properties and function in a number of biological applications.

Topic 2: Compositional Imaging of Polymer Materials with Atomic Force Microscopy

Sergei Magonov, Ph.D. (Agilent Technologies)

The current state of AFM imaging of polymer materials will be reviewed. Emphasis will be on the use of nanomechanical and electric techniques for recognition of individual components in complex multicomponent systems. Novel developments in the imaging of polymers in different environments and the examination of local dielectric properties of organic materials will be presented.

“Oliver & Pharr: The Strange New World”

Date: March 22 @ 10:00 a.m. (ET)

Topic: Exploring the Strange New World of Small-Scale Deformation with Nanoindentation

Warren C. Oliver, Ph.D. (Nanomechanics, Inc.)
George M. Pharr, Ph.D. (University of Tennessee-Knoxville)

We will jointly present some of the unexpected results that have been observed using nanoindentation. The characteristics of the data will be discussed along with our understanding of the physical phenomena that cause the observed data.

This duo’s landmark 1992 article in JMR ushered in the era of nanoindentation. According to Thomas Reuters Web of Knowledge, it is one of the most cited articles in all of material science (nearly 6,000 citations).

“Exclusive New Thin Film Method”

Date: April 5 @ 11:00 a.m. (ET)

Topic 1: Measuring Substrate-Independent Young’s Modulus of Thin Films

Jennifer Hay (Agilent Technologies)

Substrate influence is a common problem when using instrumented indentation (also known as nanoindentation) to evaluate the elastic moduli of thin films. In this seminar, a new analytic model is presented for determining the elastic modulus of the film alone when the sensed response is substantially influenced by the substrate. This new model is an improvement over previous models of the same kind, because it works well for both stiff films on compliant substrates and compliant films on stiff substrates.

Gang Feng, Ph.D. (Villanova University), will join Jenny Hay and discuss applications using the new methods.