Optimizing PXI Modular Functional Test System Throughput Webcast
ウェブセミナ（録画） | 日程/会場
Reducing overall test time in high volume electronic manufacturing sites is critical to meeting manufacturing capacity and cost targets. Optimizing throughput, while not sacrificing test coverage or production yield, is essential to retaining a competitive edge.
Best-in-class manufacturers use statistical methods during test system development to achieve high throughput without compromising test coverage or test yields. During test system development, statistically based Gauge Repeatability & Reproducibility studies are used to verify the stability of the test methods and test system. After establishing a reliable and repeatable test, methods to optimize throughput can be explored. The statistical methods can be used again to verify test throughput optimization will not impact test yields.
This Webcast will explore these statistical methods used during electronic functional test development and deployment to help the test engineer achieve accurate, reliable results.
Who should view this webcast:
• Test engineers responsible for automated test
• Aerospace and Defense
• Electronic test
• Communications & Semi-conductor testing
|無料||At Your PC||View the recording of the April 27, 2011 live broadcast|