Semiconductor Parametric Test: Back to Basics Part 2
1 小時 | 網路廣播 -- 存檔 | 地點與時間
In this "Back to Basics Part 2" seminar you will learn about: High speed measurement basics; fast pulsed IV measurements and practical capacitance measurement considerations in real life environments. You will also receive information on how to obtain your very own free copy of Agilent Technologies DC Parametric measurement handbook.
Who should view this web seminar?
This web seminar is of interest to a wide audience of engineers, scientists, educators and undergraduate students working in different fields, such as semiconductor characterization and modeling, device reliability, component test, failure analysis, and nanotechnology.
Related product information
The presenter: Dr. Stewart Wilson
Dr. Wilson holds both BSc and PhD degrees in Electronics and Electrical Engineering from the University of Glasgow, Glasgow, Scotland (UK).
Dr Wilson has worked in semiconductor and semiconductor related activities since 1979. He has worked for semiconductor device manufacturers Motorola and National Semiconductor. In addition he has worked for semiconductor equipment suppliers Eaton Corporation and Hewlett Packard/Agilent Technologies in both Europe and the United States.
Dr. Wilson is currently the European Business Manager for Agilent Technologies range Parametric Test Equipment.
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