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Advanced Product Design & Test for High-Speed Digital Devices Webcast

1   小時 | 網路廣播 -- 存檔 | 地點與時間

WHY IS THIS WEBCAST IMPORTANT?
Bit rates are now faster than ever before in today’s high-speed digital technologies. As bit rates increase, signal integrity has an even greater impact on a device’s overall system performance. Because of this, the design and verification of high-speed digital devices now requires various kinds of tests with multiple criteria, resulting in a dramatic increase in test complexity.

This webcast will discuss the latest test requirements for high-speed serial interconnects and transmitters/receivers. It will also review problems today’s digital engineers face with traditional measurement solutions. A solution will be proposed for product design and verification—an enhancement to Agilent’s E5071C ENA, Option TDR—that enables improved test efficiency, measurement accuracy and cost of ownership. A guest speaker from Granite River Lab (GRL), an official test center of several high-speed digital standards, will also discuss how GRL utilizes ENA Option TDR in practical compliance testing.
 

WHO SHOULD VIEW THIS WEBCAST?

  • Digital engineers who design and verify high speed digital devices
  • Test engineers who perform signal integrity tests to control device quality according to compliance specifications
  • Engineers and operators who use oscilloscopes, network analyzers, and signal generators for TDR measurements, S parameter measurements, and stressed eye diagram analysis with jitter insertion.
     

地點與時間

費用 地點 詳細資訊
免費 At Your PC Enroll to view Jan 18, 2012 recording 

上表所列為參考訂價,如有任何變更,恕不另行通知。

教育訓練與活動資料

Advanced Product Design & Test for High-Speed Digital Slides Part 1 
Jan 18, 2012 Webcast Slides Part 1

研討會講義 2012-01-18

PDF PDF 3.90 MB
Advanced Product Design & Test for High-Speed Digital Slides Part 2 
Jan 18, 2012 Webcast Slides Part 2

研討會講義 2012-01-18

PDF PDF 1.21 MB