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Advanced Product Design & Test for High-Speed Digital Devices Webcast

1   Hour | Webcast - Registrato | Where & When

WHY IS THIS WEBCAST IMPORTANT?
Bit rates are now faster than ever before in today’s high-speed digital technologies. As bit rates increase, signal integrity has an even greater impact on a device’s overall system performance. Because of this, the design and verification of high-speed digital devices now requires various kinds of tests with multiple criteria, resulting in a dramatic increase in test complexity.

This webcast will discuss the latest test requirements for high-speed serial interconnects and transmitters/receivers. It will also review problems today’s digital engineers face with traditional measurement solutions. A solution will be proposed for product design and verification—an enhancement to Agilent’s E5071C ENA, Option TDR—that enables improved test efficiency, measurement accuracy and cost of ownership. A guest speaker from Granite River Lab (GRL), an official test center of several high-speed digital standards, will also discuss how GRL utilizes ENA Option TDR in practical compliance testing.
 

WHO SHOULD VIEW THIS WEBCAST?

  • Digital engineers who design and verify high speed digital devices
  • Test engineers who perform signal integrity tests to control device quality according to compliance specifications
  • Engineers and operators who use oscilloscopes, network analyzers, and signal generators for TDR measurements, S parameter measurements, and stressed eye diagram analysis with jitter insertion.
     

Where & When

Price Location For more information
Free At Your PC Enroll to view Jan 18, 2012 recording 

Prices shown are list prices and are subject to change without notice.

Training & Event Materials

Advanced Product Design & Test for High-Speed Digital Slides Part 1 
Jan 18, 2012 Webcast Slides Part 1

Seminar Materials 2012-01-18

PDF PDF 3.90 MB
Advanced Product Design & Test for High-Speed Digital Slides Part 2 
Jan 18, 2012 Webcast Slides Part 2

Seminar Materials 2012-01-18

PDF PDF 1.21 MB