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EMC 2014- IEEE International Symposium on Electromagnetic Compatibility

August 5 - 7, 2014
Raleigh Convention Center
500 S. Salisbury St
Raleigh, NC

www.emc2014.org/ 

Come Visit Agilent In Booth 323

WHY THIS TRADESHOW IS IMPORTANT

In EMC testing, success depends on the tools that can help you do more in less time—today and tomorrow. Learn how Agilent can help you keep the test queue flowing with its N9038A MXE, a standards-compliant EMI receiver and diagnostic signal analyzer built on an upgradeable platform.

The MXE EMI receiver meets both commercial (CISPR 16-1-1) and military requirements (MIL-STD-461), allowing you to fully test a range of devices with outstanding accuracy and excellent sensitivity. Easily upgrade the MXE’s CPU, memory, disk drives and I/O ports to keep your test assets current and extend instrument longevity. Together with Agilent’s proven customer service and a standard 3-year warranty, the MXE delivers the precision, repeatability and reliability you need to test with confidence.

In addition to full compliance measurements with the MXE, Agilent offers precompliance measurements and diagnostic evaluation with the N6141A EMI measurement application on X-Series signal analyzers.

Agilent EEsof EDA tools provide valuable signal integrity and power integrity solutions for identifying potential sources of EMI. Utilize full design flow support starting with pre-layout analysis of SERDES channels in both frequency and time domains for differential to common mode conversion problems. Then use post-layout CAD data to analyze radiated and conducted emissions using full-wave 3D EM simulation. With Agilent EEsof EMPro you can import 3D models of your packages, PCBs and enclosures, use realistic time and frequency domain waveforms as stimulus sources, simulate emissions levels versus frequency, and compare to common FCC, CISPR and other EMI emissions standards.

Agilent’s network analyzers offer S-parameter measurements in both frequency and time domains for EMC site validation.

As high-speed designs continue evolving, signal/power integrity and other EMC problems become tightly related to each other. The Physical Layer Test Software (PLTS) and associated measurement hardware are powerful signal integrity tools for high-speed digital design, validation, and fixture removal. The ENA Network Analyzer and the new impedance analyzers enable you to characterize PDN components like capacitors and DC-DC converters for power integrity applications.

Portable RF handhelds allow you to easily monitor signals and test components.

Visit Booth 323 to find out how Agilent’s EMI design and test solutions can support you in the lab and on the bench.

Technical Paper Presentation

Dr. Colin Warwick, product manager for high-speed digital design, Agilent EEsof EDA, will present EMI/EMC Analysis for High-Speed Digital Design on Wednesday, August 6 at 2:00pm.

Dr. Fangyi Rao, Master R&D Engineer, Agilent EEsof EDA will present Jitter Induced Voltage Noise in Clock Channels, at the IEEE International Conference on Signal and Power Integrity on Tuesday, August 5, 10:30 am.

Agilent recently announced its T&M business will be known as Keysight Technologies, Inc. in early November 2014.

WHO SHOULD ATTEND

Engineers or technicians involved in EMC precompliance or full compliance conducted and radiated emissions testing to both commercial and MIL standards and design engineers involved in EM simulation and component level test.