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1-13 of 13

	Name/Description	Date
	Advanced NBTI/PBTI technical overview now available	2008-05-21
	Press release on new WGFMU module for the B1500A	2008-04-20
	B1530A WGFMU technical overview now available	2008-04-20
	Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells from Days to Hours	2007-06-11
	New Parametric Test Platform Offers unprecedented performance for engineers in semiconductor fabs, research environments	2007-04-02
	Introducing 10-nanosecond ultra-short pulsed IV parametric test solution for R&D	2006-06-05
	Next-Generation Parametric Test Software New version delivers seamless laboratory and development environment for Parametric Test on Parameter Analyzers, Desktop PCs	2006-03-03
	New Semiconductor Device Analyzer The New Agilent B1500A with its modular hardware configuration and EasyEXPERT software offers unparalleled flexibility, scalability and accuracy with integrated IV/CV capability,	2005-04-04
	Announcing New Advanced DC/RF/Pulse Parametric Test Systems 4075 and 4076 Testers meet production challenges of current 65-nm and future sub-65-nm devices, eliminate thermal effects	2005-03-23
	Information on Obsolete and Discontinued Instruments is NOW AVAILABLE! Data sheets, manuals, and application notes are now available online for the following products: 4140B, 4142B, 4145A/B, 4155A/4156A, 4155B/4156B, 4157A, 4280A, E5270A, E5272A, and E5273A.	2005-02-02
	2005 European Parametric Test Users' Conference EUROPE: 12-19 April 2005 - 1-day users’ conference for customers of Agilent's parametric test solutions.	2005-01-18
	Agilent 4157B Flexibility, expandability, and upgradeability in a PC-based measurement environment.	2004-09-19
	New parametric test solutions Europe: Learn how to reduce your cost of test with our web symposium series: 28 Sept. - 28 Oct. 2004	2004-08-30

1-13 of 13

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