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1-25 of 69
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Optimize Time Gating in Spectrum Analysis
Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.
Article 2013-03-20 |
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Turn Your Agilent Handheld Meter into a Data Logger - Case Study
Case study on how to turn Agilent Handheld Meter with U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC into a Data Logger keywords: U1177A Bluetooth Adapter, Agilent Wireless Remote Connectivity Solution, bluetooth adapter, Handheld DMM, data logger
Case Study 2013-03-11 |
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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA
Article 2012-11-30 |
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The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.
Article 2012-11-01 |
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Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.
Article 2012-10-22 |
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Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.
Article 2012-10-22 |
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Simplifying the Troubleshooting of Intercity Trains While Enhancing Worker Safety - Case Study
The Agilent Wireless Remote Connectivity Solution simplifies data logging tasks. With the free data-logging application from Agilent, the engineer can view live readings, and switch from point-to-point, or view data from up to three points simultaneously.
Case Study 2012-09-13 |
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Optimize Signal/Spectrum Analyzer Throughput for High-Volume Manufacturing Test
The Microwaves & RF article discusses how to obtain the highest throughput for the analyzers used in manufacturing test by creating a test plan that accounts for speed, repeatability, and dynamic range.
Article 2012-08-20 |
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Impedance Measurement With E5061B LF-RF Network Analyzer Slides
This presentation material describes fundamentals, calibrations, and application examples of the impedance measurement using the E5061B-3L5 LF-RF network analyzer.
Article 2012-04-22 |
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N6841A and N6854A Blog
Feature Story 2011-08-22 |
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Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine
Article 2011-05-02 |
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EE Times: Time-domain simulations of high-speed links with X parameters
Article 2011-03-29 |
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Caution: MIMO Test Challenges Ahead
Article published by Wireless Design & Development on MIMO testing challenges and methods to achieve higher data rates such as two0 and four-channel MIMO.
Article 2010-09-20 |
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X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
Journal 2010-07-30 |
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Utilizing LAN-Based Instrumentation to Measure Total Harmonic Distortion in Remote Facilities
Agilent Measurement Journal - Issue: Six - 2008
Journal 2010-07-22 |
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Microwave Engineering Europe X-parameters Article
Article 2010-06-02 |
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Identifying and Solving GSM 850 Interferences with Public Safety Communications
Identifying, solving GSM 805 interferences with public safety communications. Learn how Agilent and Bryant Solutions solved interference issues between a wireless operator and public safety agencies.
Case Study 2010-05-10 |
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Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3
Article 2010-03-25 |
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Tester overcomes RF problems with wireless network deployment and maintenance
Article reprinted with permission from AGL.
Article 2009-12-24 |
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Measuring Propagation Delay with a Universal Counter
Make a signal path delay measurement, understand precision available with counters and more. (Email address required)
Article 2009-12-18 |
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Device Characterization and Verification with the Agilent 81200
This Application Note originally was an article that appeared in the January issue of Microwave Product Digest. The Note shows you how to do device characterization and verification with the Agilent 81200 Data Generator/Analyzer Platform.
Article 2009-11-25 |
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X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters
Article 2009-10-09 |
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Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz
Article 2009-07-23 |
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DAQ with Matlab for Medical Science
Agilent data acquisition (DAQ) units can now work with MATLAB in medical research, as illustrated by the case study. This helps users to understand the basics of MATLAB programming in Agilent USB DAQ.
Case Study 2009-06-16 |
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TD-LTE Technology And Its Measurements
Feature Story 2009-05-14 |
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