Contact an Expert

Technical Support

Test & Measurement

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Application

By Type of Content

By Product Category

1-25 of 27

Sort:
Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-05-06

PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2011-04-13

PDF PDF 3.07 MB
HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2010-05-20

PDF PDF 1.37 MB
Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2009-12-08

PDF PDF 1.43 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Jitter Solutions for Telecom, Enterprise, and Digital Designs
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

Brochure 2008-06-25

PDF PDF 3.49 MB
Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
Complete solutions for characterization, debug, compliance test of HDMI designs
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs

Brochure 2007-10-19

PDF PDF 1.12 MB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
HDMI Sink and Source Compliance Test and Characterization
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

Application Note 2006-10-27

PDF PDF 431 KB
Languages 
Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.

Application Note 2006-08-29

PDF PDF 444 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
Mastering Jitter in Serial Gigabit Designs
Mastering Jitter in Serial Gigabit Designs

Promotional Materials 2006-06-22

PDF PDF 1.01 MB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.

Application Note 2006-01-30

PDF PDF 1.31 MB
Languages 
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Application Note 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Application Note 2005-08-29

PDF PDF 1.28 MB
PCI Express Receiver Design Validation Test with 81134A / 81250A
Describes functional validation and compliance and stress tests for PCI Express receiver design

Application Note 2005-03-18

PDF PDF 2.01 MB
Languages 
Flat Panel Display Link Test
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Agilent 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

PDF PDF 128 KB
Languages 
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Application Note 2003-12-02

PDF PDF 3.18 MB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

PDF PDF 1.70 MB
Languages 
Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

PDF PDF 4 MB
Languages 

1 2 Next