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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2014-07-09

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

PDF PDF 746 KB
J-BERT N4903B High-Performance Serial BERT - Data Sheet
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

Data Sheet 2014-06-12

Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Agilent

Solution Brief 2014-04-29

DisplayPort 1.2 Link Layer Testing - FuturePlus
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Agilent.

Solution Brief 2014-04-29

DDR4 Protocol Analysis - FuturePlus
DDR4 Protocol Analysis from FuturePlus and Agilent.

Solution Brief 2014-04-29

Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Agilent E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Agilent E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Agilent E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-04-21

Agilent's Certification of HDMI 2.0 Test Solution
Agilent Technologies Announces Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

Oscilloscope Probe Switching - BitifEye
Oscilloscope Probe Switching Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

HDMI Cable Testing - BitifEye
HDMI Cable Testing Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

USB 3.0 Cable Testing - BitifEye
USB 3.0 Cable Testing Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

MIPI™ Phy S-Param & Impedance Conformance Test - Test Solution Overview Using the ENA Option TDR

Technical Overview 2014-04-08

PDF PDF 2.92 MB
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests
Agilent Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
ADS Videos on YouTube
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

Demo 2014-03-20

Discovering ADS
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

Demo 2014-03-20

Digital Design & Interconnect Standards - Brochure
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2014-02-20

PDF PDF 6.47 MB
ADS 2014 Dramatically Improves Design Productivity and Efficiency
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-02-18

PDF PDF 2.99 MB
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2014-02-18

PDF PDF 3.28 MB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-02-18

PDF PDF 8.07 MB

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