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The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

型錄 2014-01-22

Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Agilent parametric measurement instruments.

選購指南 2013-12-09

Agilent Pulsed-IV Parametric Test Solution - Selection Guide
This Pulsed-IV selection guide provides an overview and side-by-side comparison of all of Agilent's pulsed-IV parametric test solutions to determine the best solution to meet your unique needs.

選購指南 2013-12-04

EasyEXPERT Online Help
Online help file for EasyEXPERT and Desktop EasyEXPERT software

輔助說明檔 2013-10-31

HTML HTML 4.04 MB
B1500A Semiconductor Device Analyzer - Data Sheet
The Agilent B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Agilent's new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Agilent B1500A can be used for a wide range of semiconductor device characterization needs.

產品型錄 2013-10-29

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

應用手冊 2013-09-10

EasyEXPERT Software User's Guide Vol. 1
Provides the reference information of Agilent EasyEXPERT software.

使用手冊 2013-06-30

EasyEXPERT Software User's Guide Vol. 2
Provides the reference information of Agilent EasyEXPERT software.

使用手冊 2013-06-30

EasyEXPERT Software Application Library Reference
Provides a detailed description of the application tests furnished with Agilent EasyEXPERT and Desktop EasyEXPERT

參考指南 2013-06-30

EasyEXPERT Software Self-paced Training Manual
Self-paced training manual for EasyEXPERT Software.

使用手冊 2012-11-01

PDF PDF 23 MB
B1542A Pulsed IV Package User's Guide
Covers operation, installation, and reference information of Pulsed IV Package for B1500A/EasyEXPERT.

使用手冊 2012-02-01

PDF PDF 4.16 MB
Agilent 4082F Flash Memory Cell Parametric Test System
This 22-page data sheet details the features, capabilities and specifications of the Agilent 4082F Flash Memory Cell Parametric Test System.

產品型錄 2011-12-19

PDF PDF 620 KB
Agilent 4082A Parametric Test System
The 4082A Parametric Test System is designed to perform fast and precise DC measurements, capacitance measurements, and other high frequency applications such as ring oscillator measurements.

產品型錄 2011-11-11

PDF PDF 854 KB
B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.

使用手冊 2011-08-01

E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

使用手冊 2011-08-01

使用Agilent B1500A 量測 CNT FET 及 CNT SET
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.

應用手冊 2011-02-14

Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

應用手冊 2011-02-08

PDF PDF 3.57 MB
Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

應用手冊 2011-02-08

PDF PDF 1.47 MB
Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

應用手冊 2011-02-08

PDF PDF 1.61 MB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

應用手冊 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

應用手冊 2011-02-06

PDF PDF 331 KB
AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

應用手冊 2010-04-02

41000 Series Integrated Parametric Analysis & Characterization Environment Administration Guide
Describes the specifications, installation, operation, and service information of the 41000 series, Agilent iPACE.

使用手冊 2009-07-01

4155C/4156C Semiconductor Parameter Analyzer User's Guide 1
Covers product introduction, installation, LAN connection, file operation, print/plot function, etc.

使用手冊 2009-07-01

Obsoleted Parametric Test Products
Specifications are not available from this site.

技術總覽 2009-05-07

TXT TXT 1 KB

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