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An Outlier Detection Based Approach for PCB Testing
This paper discusses enhancements to the capacitative leadframe testing technique, more commonly known as the Agilent patented VTEP technology. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 1004 KB
Testing Bridges to Nowhere-Combining Boundary Scan and Capacitive Sensing
This paper describes existing limitations of the 1149.1 boundary scan techniques, IC design changes that would address these limitations and some experimental results. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 455 KB
Applications of KFM and CSAFM/STM in Characterizations of Photovoltaic Materials

Application Note 2009-12-18

PDF PDF 616 KB
Scratch Testing of Hard Drive Components

Application Note 2009-12-16

PDF PDF 691 KB
Creating, Editing, Transferring Arbitrary Waveforms with Agilent U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

Application Note 2009-12-11

Fading WiMAX™ testing with Agilent's E6651A and an Elektrobit Propsim C8
This application note describes how to perform receiver testing in a faded environment with the E6651A Mobile WiMAX test set, the N6422C Wireless Test Manager software and a channel emulator

Application Note 2009-12-07

PDF PDF 788 KB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series
Agilent's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2009-12-02

PDF PDF 332 KB
Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2009-12-02

Functional A-GPS Receiver Test Using the 8960 and E4438C - Application Note
This application note describes a test system that uses and 8960 Wireless Communications Test Set in conjunction with an E4438C ESG Vector Signal

Application Note 2009-11-24

Study the Mechanical Properties of Red Blood Cells

Application Note 2009-11-12

PDF PDF 190 KB
Nanoindentation of a Multiphase Composite with NanoVision

Application Note 2009-11-11

PDF PDF 197 KB
Measuring Storage & Loss Modulus of Artificial Tissue Using a Nano Indenter G200

Application Note 2009-11-11

PDF PDF 209 KB
Mechanical Characterization of Ceramic Particles Using a Nano Indenter G200

Application Note 2009-11-11

PDF PDF 151 KB
USB Design and Test - A Better Way - Application Note
Brochure covering Agilent's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2009-11-03

Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Agilent VTEP, FrameScan FX and TestJet Enhanced technologies.

Application Note 2009-11-03

PDF PDF 214 KB
Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Instrumented Indentation Testing with the Agilent Nano Indenter G200

Application Note 2009-10-13

PDF PDF 674 KB
How to Select the Correct Nanoindenter Tip

Application Note 2009-10-12

PDF PDF 868 KB
Fading WiMAX™ testing with Agilents E6651A and an Azimuth ACE
This application note describes how to perform receiver testing in a faded environment with the E6651A Mobile WiMAX test set, the N6422C Wireless Test Manager software and a channel emulator - the Azimuth ACE MX radio channel emulator in this case.

Application Note 2009-10-07

PDF PDF 836 KB
MIMO in LTE Operation and Measurement-Excerpts on LTE Test - Application Note
Focuses on MIMO radio operation and implementation as it applies to Long Term Evolution (LTE). MIMO (spatial multiplexing) is one of several multiple antenna techniques being implemented in LTE.

Application Note 2009-10-06

Quantitative Mechanical Measurements at the Nano-Scale Using the DCM II

Application Note 2009-09-29

PDF PDF 295 KB
High frequency probing solutions for time and frequency domain
This application note discusses high-frequency probing using U1818A/B active differential probes with a network, spectrum, and signal source analyzer.

Application Note 2009-09-23

MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009 - Application Note
MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009

Application Note 2009-09-17

PDF PDF 2.12 MB
Creating Hardware Handler in C/C++ for Agilent TestExec SL
A hardware handler enhances the Agilent TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB

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