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Contact Deformation of LiNbO3 Single Crystal:Dislocations, Twins and Ferroelectric Domains
A Study of a combined nanoindentation and AFM investigation showing that twinning and dislocation motion are two major deformation mechanisms under contact loading in periodically poled (0001) LiNbO3.

Application Note 2013-11-01

PDF PDF 752 KB
Determining Critical Stresses in Semiconductors: Using ZnO Crystal & GaN Freestanding Film
A study of the nanoindenter G200 used to perform spherical nanoindentation experiments on ZnO single crystal and GaN freestanding film.

Application Note 2013-10-30

PDF PDF 363 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
FET Switch Speed and Settling Time - Application Note
This publication describes the occurrence and some of the possible solutions for “slowtails” FET switch behavior.

Application Note 2013-10-29

PDF PDF 141 KB
TC611 GaAs Detector Diode Sensitivity Measurements - Application Note
This publication presents detector voltage measurements, compared to the deviation from linearity (referenced to -40 dBm).

Application Note 2013-10-29

PDF PDF 380 KB
Eight Hints for Better Scope Probing - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2013-10-28

Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2013-10-26

PDF PDF 331 KB
High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 520 KB
Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Application Note 2013-10-23

PDF PDF 141 KB
GaAs MMIC ESD, Die Attach and Bonding Guidelines - Application Note
This application note contains information on die attach methods and bonding methods for integrated circuits.

Application Note 2013-10-22

PDF PDF 317 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 128 KB
Releasing the “Test Sequence” and “Test” to Production on the Agilent x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Agilent x1149 Boundary Scan Analyzer.

Application Note 2013-10-18

PDF PDF 523 KB
Mapping the Mechanical Properties of Cement-based Materials Using CSM &Ultra-fast Nanoindentation
Study of hydration mechanisms of a commercial cement paste that has been h investigated with the use of the G200 using innovative statistical ultra-fast nanoindentation.

Application Note 2013-10-15

PDF PDF 930 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2013-10-09

PDF PDF 214 KB
Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter
Case study of the changes in elastic modulus and hardness of thin film as measured using the nanoindenter and the continuous stiffness measurement option, which measures the mechanical properties as a continuous function of depth.

Application Note 2013-09-30

PDF PDF 469 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 142 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 226 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 234 KB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 184 KB
Surface Potential Measurements Using the Agilent 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
The Revolutionary Impact of the Oliver and Pharr Technique on the Science of Hardness Testing
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2013-09-13

PDF PDF 120 KB
Magnetic Force Microscopy Studies Using the Agilent 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 524 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 274 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 122 KB

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