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251-275 of 942
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First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.
Application Note 2008-09-26 |
PDF
131 KB
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codeNexus - Defect Reporter
Defect Reporter enchancement for the Medalist 5DX Automated X-ray Inspection System
Application Note 2008-09-26 |
PDF
764 KB
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Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.
Application Note 2008-09-26 |
PDF
629 KB
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The Benefits of and Considerations for the Embedded CDR in the N5980A
Application Note 2008-09-16 |
PDF
591 KB
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DVD Player Manufacturing Test Using Agilent Modular Instruments
Audio and video testing of modern digital video disc (DVD) player using Agilent’s USB modular oscilloscopes and USB modular switch matrix.
Application Note 2008-09-15 |
PDF
1.43 MB
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A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate
synchronous dynamic random access memory) signals.
Application Note 2008-09-10 |
PDF
792 KB
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
Application Note 2008-09-04 |
PDF
849 KB
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Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.
Application Note 2008-09-03 |
PDF
628 KB
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Slashing Debugging time with the Agilent Medalist i3070 In-Circuit Test AutoDebug Tool
This app note provides an overview of the AutoDebug tool on the Agilent Medalist i3070 In-Circuit Test Software version 07.00.
Application Note 2008-09-01 |
PDF
324 KB
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Signal Reception and A/V Functionalities Test
This application guide describe how TV manufacturer measures TV’s ability to tune to radio frequency (RF), TV signal inputting from the RF coaxial input (ANT IN) and direct video and audio input.
Application Note 2008-09-01 |
PDF
441 KB
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TV and Video Test Solutions for TV and DVD Player Manufacturers
This application guide describe various Agilent solutions in the TV and DVD manufacturing line. In this guides is shows where U8101A is being used in various display testing application.
Application Note 2008-08-29 |
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Scanning Microwave Microscope
Application Note 2008-08-26 |
PDF
348 KB
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Introduction to Scanning Microwave Microscopy
Application Note 2008-08-26 |
PDF
334 KB
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Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.
Application Note 2008-08-26 |
PDF
492 KB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Application Note 2008-08-18 |
PDF
1.87 MB
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Displaying menus in two languages on Agilent Medalist i3070 Graphical User Inter
This application note describes how users of the Agilent Medalist i3070 In-Circuit Test system can enable the menu-driven user interface to display the menu items in two languages.
Application Note 2008-08-14 |
PDF
583 KB
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On-Wafer Testing of Opto-Electronic Components Using LCA's
This document describes the principles of on-wafer measurements on opto-electronic components
Application Note 2008-08-13 |
PDF
1.57 MB
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Testing Video Call Capabilities of W-CDMA User Equipment (R&D only)
Learn how to use Agilent solutions to reliably test video capabilities of W-CDMA user equipment.
Application Note 2008-08-12 |
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Television Power Consumption Testing Application Note
This application notes explains how U8101A is being used in the TV power consumption testing.
Application Note 2008-08-12 |
PDF
168 KB
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Fast Device Tune Measurement Solution for Calibrating W-CDMA Mobile Phones
Learn how Agilent’s Fast Device Tune measurement minimizes calibration test time.
Application Note 2008-07-29 |
PDF
685 KB
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
Application Note 2008-07-28 |
PDF
512 KB
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Merging Windowed Deposits in CamCad on Agilent’s Automated Optical Inspection (AOI) Systems
In many stencil designs, windowed deposits are used to apply paste to a large pad. This document provides some tips for dealing with this.
Application Note 2008-07-23 |
PDF
352 KB
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Mobile WiMAX™ PHY Layer (RF) Operation and Measurement
This application note describes the operation and physical layer measurements of 802.16e OFDMA Mobile WiMAX devices.
Application Note 2008-07-17 |
PDF
7.84 MB
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10 Hints for Getting More from Your Function Generator (AN 1497)
The 10 hints in this application note will help you take advantage of the features of your function/arbitrary waveform generator so you can get your job done more easily.
Application Note 2008-07-16 |
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Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.
Application Note 2008-07-15 |
PDF
658 KB
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