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Configuring Boundary Scan Chains on Agilent x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Merging boards on Agilent x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Achieve Accurate Two Wire Resistance Measurements with the Agilent 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Agilent 34980A and a multiplexer.

Application Note 2013-07-24

PDF PDF 424 KB
Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Agilent’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

PDF PDF 2.23 MB
Achieve Accurate Resistance Measurements with the Agilent 34980A Multifunction Switch Measure Unite
This application note provides an overview of how to make an accurate 2-wire, 3-wire and 4-wire resistance measurements with the Agilent 34980A

Application Note 2013-07-10

PDF PDF 176 KB
In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 256 KB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Agilent MOI for SATA RSG Tests

Application Note 2013-06-10

PDF PDF 2.45 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2013-05-07

Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Application Note 2013-05-03

PDF PDF 987 KB
Increasing Manufacturing Throughput of Automotive Controllers - Application Note
This application note describes how automotive manufacturers can boost throughput using the Agilent TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

Application Note 2013-04-18

PDF PDF 783 KB
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Tensile Testing of Fibers using Agilent T150 UTM Quasi-static Tensile Test
The Agilent T150 UTM is a specifically designed instrument to measure the tensile properties of wide range of fibers with small cross-sectional diameters. this application note discussed testing of various fibers

Application Note 2013-04-08

PDF PDF 188 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2013-03-13

PDF PDF 220 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2013-03-12

PDF PDF 186 KB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

Graphene Studies: Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene

Application Note 2013-03-04

PDF PDF 738 KB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Optimize burn-in test with the Agilent 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Agilent 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Seeing is Believing:Video integration for Agilent UTM T150 - Application Note
Overview of features and benefits using video integration on the T150 UTM

Application Note 2013-01-16

PDF PDF 202 KB

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