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176-200 of 942

Nanoindentation of a Multiphase Composite with NanoVision Application Note 2009-11-11	PDF 197 KB
Vectorless Test Solutions --An analysis of performance differences between VTEP This white paper provides an analysis of performance differences between Agilent VTEP, FrameScan FX and TestJet Enhanced technologies. Application Note 2009-11-03	PDF 214 KB
USB Design and Test - A Better Way Brochure covering Agilent's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these. Application Note 2009-11-03	PDF 821 KB Languages English \| 2009-11-03 \| PDF 821 KB 日本語 \| 2010-02-26 \| PDF 4.56 MB
Tips for Optimizing Your Switch Matrix Performance This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution. Application Note 2009-10-22	PDF 359 KB Languages English \| 2009-10-22 \| PDF 359 KB 日本語 \| 2010-02-08 \| PDF 880 KB
Instrumented Indentation Testing with the Agilent Nano Indenter G200 Application Note 2009-10-13	PDF 674 KB
How to Select the Correct Nanoindenter Tip Application Note 2009-10-12	PDF 868 KB
Fading WiMAX™ testing with Agilents E6651A and an Azimuth ACE This application note describes how to perform receiver testing in a faded environment with the E6651A Mobile WiMAX test set, the N6422C Wireless Test Manager software and a channel emulator - the Azimuth ACE MX radio channel emulator in this case. Application Note 2009-10-07	PDF 836 KB
MIMO in LTE Operation and Measurement-Excerpts on LTE Test Focuses on MIMO radio operation and implementation as it applies to Long Term Evolution (LTE). MIMO (spatial multiplexing) is one of several multiple antenna techniques being implemented in LTE. Application Note 2009-10-06	PDF 1.16 MB Languages English \| 2009-10-06 \| PDF 1.16 MB 日本語 \| 2010-02-03 \| PDF 4.72 MB
Quantitative Mechanical Measurements at the Nano-Scale Using the DCM II Application Note 2009-09-29	PDF 295 KB
High frequency probing solutions for time and frequency domain This application note discusses high-frequency probing using U1818A/B active differential probes with a network, spectrum, and signal source analyzer. Application Note 2009-09-23	PDF 377 KB Languages English \| 2009-09-23 \| PDF 377 KB 日本語 \| 2009-10-14 \| PDF 2.35 MB
MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009 MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009 Application Note 2009-09-17	PDF 2.12 MB
Creating Hardware Handler in C/C++ for Agilent TestExec SL A hardware handler enhances the Agilent TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL. Application Note 2009-09-10	PDF 181 KB
3GPP Long Term Evolution: System Overview, Product Development and Test Challenges This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology. Application Note 2009-09-08	PDF 3.69 MB Languages English \| 2009-09-08 \| PDF 3.69 MB 日本語 \| 2010-01-12 \| PDF 7.11 MB
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products. Application Note 2009-09-07	PDF 739 KB Languages English \| 2009-09-07 \| PDF 739 KB 中文（简体） \| 2006-08-01 \| PDF 1.79 MB 日本語 \| 2007-02-05 \| PDF 1.40 MB
Built in Test Coverage and Diagnostics : Best Practices to Achieve Built in Test Success Application Note 2009-09-01	PDF 148 KB
IEEE 802.15.4/ZigBee Measurements Made Easy Using the N4010A Wireless Connectivity Test Set Application Note 2009-08-21	PDF 810 KB Languages English \| 2009-08-21 \| PDF 810 KB 日本語 \| 2006-08-22 \| PDF 1.68 MB
Applications of KFM, CSAFM and Environmental Control in Fuel Cell Research Application Note 2009-08-19	PDF 451 KB
Configuring Signal and Load Switching Using Agilent TestExec SL This application note describes how users of the Agilent TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software. Application Note 2009-08-13	PDF 286 KB
High-Resolution Tip Positioning Facilitates In Situ AFM Studies Application Note 2009-08-12	PDF 378 KB
Mechanical Characterization of Sol-Gel Coatings Using a Nano Indenter G200 Application Note 2009-08-06	PDF 1.73 MB
Creating Arbitrary Waveforms in the U2300A Series and U2500A Series Data Acquisition Devices This application note covers the inner workings of how waveforms and arbitrary waveforms are formed. Application Note 2009-08-01
Database Connectivity Guide for TestExec SL This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database. Application Note 2009-07-16	PDF 434 KB
Customizing the Agilent TestExec SL Operator Interface using Visual Basic This application note describes how users of the Agilent TestExec SL software can customize the operator user interface using Visual Basic. Application Note 2009-07-07	PDF 312 KB
Testing of a MEMS-based IC Probe with NANO INDENTER G200 and NanoSuite EXPLORER Application Note 2009-07-07	PDF 994 KB
Tensile Testing of Basalt Fibers Using a T-150 Application Note 2009-07-06	PDF 1.35 MB

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