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New challenges for UE Developers with Voice transport over LTE Webcast
Original broadcast Jan 24, 2012

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New impedance measurement solutions and applications using a Vector Network Analyzer - Web Seminar
This webcast focuses on impedance measurements, and presents what's new with and how to use the Vector Network Analyzer. We’ll provide tips for evaluating passive components used in electronic circuits / equipments, and characterizing power…

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Next Generation 802.11ac WLAN MIMO Design & Test Challenges
Original broadcast May 10, 2012

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Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast
Original broadcast January 21, 2014

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NFC Test Challenges for Mobile Device Developers Webcast
Original broadcast February 26, 2013

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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

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Optimize UE Design for Greater Battery Run-Time
Original broadcast April 26, 2012

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Optimize Wireless Device Battery Run-time: Two Part Webcast Series
Original roadcasts Aug 22 & Sept 19, 2012

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Oscilloscope Measurements Webcast Series
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

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Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM
Original broadcast February 13, 2014

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Phase Noise Measurement Methods and Techniques
Original broadcast July 19, 2012

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Practical Guide to 100G Electrical Compliance Testing Webcast
Original broadcast August 28, 2013

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Primer: A Day in the Life of your Cell Phone
Live broadcast July 24, 2014; 10am PT/1pm ET

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RF and Microwave Education Series
Webcast Series

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RF Streaming, Analysis and Playback in Aerospace & Defense Applications
Original broadcast Mar 15, 2012

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Scientific Nanoindentation e-Seminars (aka webcasts)
Originaly live broadcasts, Feb-April, 2011

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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SFP+ and 10GBASE-KR Transmitter Compliance Testing using an Oscilloscope Webcast
Original broadcast February 19, 2014

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Signal Analyzer Fundamentals and New Applications Webcast
Original broadcast March 13, 2013

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Signal Generator Fundamentals and New Applications Webcast
Original broadcast January 30, 2013

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Signal Integrity: Include Post-layout PCB Artwork into your Eye Diagram and BER Contour Simulation
Originally broadcast May 5, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.

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Simulating Power Transients and Noise
Original broadcast Jun 21, 2012

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Specific Training for the 8960 Series 10
Agilent's education and training programs help you achieve full value of your 8960 Series 10 wireless communications test set.

トレーニング資料 2001-09-21

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