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Electronic Measurement

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High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Agilent Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Press Releases for N5990A
Press Releases for N5990A

Press Materials 2013-07-04

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

PCI Express Design and Test From Electrical to Protocol - Brochure
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2011-04-13

PDF PDF 3.07 MB
HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2010-05-20

PDF PDF 1.37 MB
Serial ATA Design and Test, A better way - Brochure
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2009-12-08

PDF PDF 1.43 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
Using Equalization Techniques on Your Infiniium 90000A Series Oscilloscope
A transmitter sends a serial signal over a transmission channel (examples: backplane, cable) to a receiver. As the signal rate increases, the channel the signal travels through distorts the signal at the receiver.

Application Note 2009-02-17

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Method of Implementation (MOI) for DisplayPort Sink Compliance Test - Application Note
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Jitter Solutions for Telecom, Enterprise, and Digital Designs - Brochure
Complete solutions for characterization and test of jitter in high-speed digital transmission systems, high-speed I/O connections, and buses.

Brochure 2008-06-25

PDF PDF 3.49 MB
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

Complete solutions for characterization, debug, compliance test of HDMI designs - Brochure
This brochure discusses test solutions for HDMI. Thorough characterization and validation of HDMI-based designs

Brochure 2007-10-19

PDF PDF 1.12 MB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices - App Note
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A - App Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB

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