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Electronic Measurement

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High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Agilent Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
Using Equalization Techniques on Your Infiniium 90000A Series Oscilloscope
A transmitter sends a serial signal over a transmission channel (examples: backplane, cable) to a receiver. As the signal rate increases, the channel the signal travels through distorts the signal at the receiver.

Application Note 2009-02-17

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

Method of Implementation (MOI) for DisplayPort Sink Compliance Test - Application Note
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices - App Note
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices

Application Note 2007-06-19

PDF PDF 214 KB
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1)
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A - App Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

HDMI Sink and Source Compliance Test and Characterization - Application Note
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

Application Note 2006-10-27

Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3)
Debugging USB 2.0 Systems

Application Note 2006-10-05

Automated PCI Express Receiver Compliance Test and Characterization with N5990A - Application Note
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.

Application Note 2006-08-29

PDF PDF 444 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with J-BERT N4903A - App Note
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB

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