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MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5
Serial ATA Interoperability Program Revision 1.5 Agilent MOI for SATA RSG Tests

Application Note 2013-06-10

PDF PDF 2.45 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2013-05-31

PDF PDF 1.40 MB
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2013-05-07

PDF PDF 2.90 MB
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

PDF PDF 1.71 MB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

PDF PDF 1.41 MB
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Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Quality Measures for Complex Modulated Signals Reaching for Standardization - Application Note
Complex modulation is now being broadly accepted in optical data transmission. The app note investigates if the quality parameters are ready to be standardized and to replace traditional parameters.

Application Note 2013-02-19

PDF PDF 563 KB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Technical Paper for Kalman Filter Based Modulation Analysis
Technical paper for Kalman Filter Based Modulation Analysis.

Application Note 2012-11-28

Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.

Application Note 2012-11-11

PDF PDF 1.56 MB
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Evaluating Oscilloscope Bandwidths for your Application
This application note provides some helpful hints on how to select an oscilloscope with the appropriate bandwidth for analog and digital applications.

Application Note 2012-11-08

PDF PDF 2.80 MB
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Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

Application Note 2012-08-17

PDF PDF 942 KB
IVI-COM driver and VISA-COM I/O programming examples in Microsoft Visual C# - Application Note
This application note details the installation instructions and Visual C# programming examples for Agilent Technologies IVI-COM instrument drivers and VISA-COM I/O.

Application Note 2012-07-30

PDF PDF 2.37 MB
Ten things to Consider when Selecting your Next Oscilloscope - Application Note
You rely on your oscilloscope every day, so selecting the right one to meet your needs is an important task. Comparing specs and features of scopes made by different manufacturers can be time-consuming and confusing. The concepts outlined here are intended to speed your selection process and help you avoid some common pitfalls. No matter who makes the scopes you are considering, carefully analyzing each one in relation to the 10 issues discussed here will help you evaluate the instruments objectively.

Application Note 2012-05-15

PDF PDF 755 KB
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All-states measurement method for PDL and PER with a synchronous polarization scrambler
This synchronized all-states PDL method using the Agilent N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

Application Note 2012-03-27

PDF PDF 697 KB
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8)
Due to the inherent limitations of parallel technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.

Application Note 2012-01-31

PDF PDF 2.73 MB
Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Application Note 2012-01-27

PDF PDF 2.30 MB
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Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Agilent continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Application Note 2011-12-22

PDF PDF 1.10 MB
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Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.

Application Note 2011-12-22

PDF PDF 1.20 MB
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How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

PDF PDF 3.22 MB
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Understanding The Oscilloscope Jitter Specifi cation
Jitter is defined as the unwanted phase modulation of a digital signal, and is considered one of the most important specifications for measuring a device's quality.

Application Note 2011-09-30

PDF PDF 581 KB
Techniques for Higher Accuracy Optical Measurements
Learn techniques for high accuracy optical measurements using System Impulse Response Correction

Application Note 2011-09-21

PDF PDF 6.06 MB
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