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PDF
162 KB
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Accurate Characterization of Source Spectra Using an Optical Spectrum Analyzer, AN1550-5
This application note gives a descriptive overview of how light sources emit light and how the important parameters can be measured using an Optical Spectrum Analyzer.
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2001-02-01
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Application Note
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Connector Quality Verification
Small footprint for highly accurate connector quality test.
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2002-10-29
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Application Note
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PDF
226 KB
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Does your TLS have specifications pertinent to swept measurements?
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).
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2002-07-10
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Application Note
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PDF
356 KB
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EDFA Testing with the Interpolation Technique
This product note describes the measurement of erbium-dopedfiber amplifiers (EDFA's) with an optical spectrum analyzer(OSA) using the interpolation measurement technique.
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2000-09-01
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Application Note
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Generic Test Processes in Manufacturing Cycles
The ability to manage quality in manufacturing requires the implementation of suitable tools to actually evaluate production processes.
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2002-10-29
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Application Note
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PDF
205 KB
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Improving Chromatic Dispersion and PMD Measurement Accuracy
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2005-05-18
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Application Note
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In Process Test - Fiber Bragg Grating Control
Fasten throughput for manufacturing process control.
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2002-10-29
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Application Note
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Laser Chirp
Chirp is a measure of the change in transmitter optical frequency as the transmitter is modulated.
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2008-06-04
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Application Note
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PDF
500 KB
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Making Time Resolve Chirp Measurements
This application note covers laser modulation methods, time-resolved chirp (TRC) measurement methods, and applications of TRC measurement data to predict laser perfomance in a transmission system.
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2002-03-12
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Application Note
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PDF
219 KB
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Making transient optical power measurements with the N7744A and N7745A Multiport Optical Power Meter
This note shows how to measure transient and time-dependent optical signals, both of which are related to the fast sample rate and data throughput of the N7744A and N7745A multiport power meters.
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2009-03-04
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Application Note
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PDF
672 KB
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Measuring IL and PDL spectra with the fast-switching N7786B
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.
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2009-04-10
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Application Note
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PDF
545 KB
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Measuring Polarization Dependent Loss of Passive Optical Components
A new document on the methods of characterizing passive optical components.
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2008-12-01
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Application Note
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PDF
260 KB
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Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.
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2002-03-11
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Application Note
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Multiplexer / Demultiplexer Final Test
Top yield for high channel count devices with the Photonic Foundation Library
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2002-10-29
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Application Note
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PDF
4.31 MB
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Optical All-Loss Test Solution
The Optical Loss Analyzer (OLA) test solution measures Insertion Loss, Polarization Dependent Loss and Return Loss.
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2002-01-17
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Application Note
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PDF
222 KB
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Optical Spectrum Analysis Basics (AN 1550-4)
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...
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2000-09-01
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Application Note
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PDF
642 KB
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Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5)
The product note explains how the Agilent OSA amplifier test application provides a cost-effective solution for reducing test time.
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2002-03-15
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Application Note
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PDF
716 KB
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Optical Spectrum Analyzer WDM Test Application, Product Note 86140-4 (PN 86140-4)
This product note describes how WDM system designers and manufacturers can use the 8614XB OSA's WDM test application to quickly and accurately characterize their systems. It includes specifications for optical signal-to-noise ratio only.
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2001-12-20
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Application Note
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PDF
353 KB
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Optimizing Remote Measurement Speed for the 8614XB Optical Spectrum Analyzers
This product note discusses how to increase speed during remote operations. Contains test samples and programming information.
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2001-06-01
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Application Note
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PACT - Passive Component Test
Application Notes & Technical Papers for Passive Component Test
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2007-12-27
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Application Note
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PDF
263 KB
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PDL Measurements Using the Agilent 8169A Polarization Controller
This product note discusses the polarization dependent loss (PDL) measurement process; in particular using the 8169APolarization controller.
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2002-01-09
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Application Note
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PDF
287 KB
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Photonic Foundation Library Fast Sweep PDL
This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.
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2002-07-09
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Application Note
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PDF
6.53 MB
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Photonic Foundation Library: Creating Software for Optical Component Tests
This guide teaches extensive programming techniques using the Photonic Foundation Library and its pre-compiled accessory application.
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2001-11-05
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Application Note
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PDF
602 KB
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Photonic Foundation Library: Enhancing Swept Loss Measurements
This application note describes the measurement functionality and the accuracy enhancements enabled by the know-how contained in the Photonic Foundation Library.
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2002-03-21
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Application Note
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PDF
211 KB
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PMD Tolerance Testing of Optical Interfaces
This application note details the different setups focusing on PMD, with regards to improving test conditions and shortening the length of the testing time.
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2007-10-12
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Application Note
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