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Accurate Capacitance Characterization at the Wafer Level
This application note describes the procedures required to precisely evaluate the capacitance of a Device Under Test (DUT) when using a 4080 series tester with an automatic wafer prober.

Application Note 2011-02-08

PDF PDF 1.61 MB
Low Current Measurement Technologies in Agilent 4080 Parametric Test System
This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput by focusing on the several key items.

Application Note 2011-02-08

PDF PDF 1.47 MB
Making Matching Measurements for Use in IC Design
This application note addresses the issue of component matching from a measurement perspective, and it explains how to utilize Agilent 4080 series parametric test systems to make these measurements.

Application Note 2011-02-08

PDF PDF 3.57 MB
High Speed Parametric Test using Agilent 4080 Series Tester
This application note describes know-how and techniques to make high speed parametric testing for semiconductor device characterizations by using the Agilent 4080 series parametric test systems.

Application Note 2011-02-06

PDF PDF 913 KB
Accurate and Efficient Frequency Evaluation of a Ring Oscillator
This application note introduces a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

Application Note 2011-02-06

PDF PDF 331 KB
AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

Application Note 2010-04-02

PDF PDF 944 KB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Application Note 2009-06-17

PDF PDF 2.02 MB
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Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

PDF PDF 283 KB
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Signal Reception and A/V Functionalities Test
This application guide describe how TV manufacturer measures TV’s ability to tune to radio frequency (RF), TV signal inputting from the RF coaxial input (ANT IN) and direct video and audio input.

Application Note 2008-09-01

PDF PDF 441 KB
TV and Video Test Solutions for TV and DVD Player Manufacturers
This application guide describe various Agilent solutions in the TV and DVD manufacturing line. In this guides is shows where U8101A is being used in various display testing application.

Application Note 2008-08-29

PDF PDF 567 KB
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Television Power Consumption Testing Application Note
This application notes explains how U8101A is being used in the TV power consumption testing.

Application Note 2008-08-12

PDF PDF 168 KB
A Complete Solution for Evaluating Write/Erase Characteristics of Flash Memory Cells
This application note describes how to use the Agilent 4082F Flash Memory Cell Test System and its high-voltage semiconductor pulse generator units to characterize state-of-the-art flash memory technologies such as MLC and high-density NAND flash.

Application Note 2008-01-23

PDF PDF 957 KB
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Technical Overview :Technique for Controlling Agilent External DC Power Supply
Technique for Controlling Agilent External DC Power Supply From SMU to expand SMU output power capability.

Application Note 2006-08-01

PDF PDF 1.01 MB
AN B1500A-3 IV and CV Measurement Using the Agilent B1500A MFCMU and SCUU
This application note describes how to make current-voltage and capacitance-voltage measurements using the B1500A multifrequency capacitance measurement unit and SMU CMU unify unit.

Application Note 2005-08-01

PDF PDF 1.20 MB
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AN B1500A-1 Measuring CNT FETs and CNT SETs Using the Agilent B1500A
The Agilent B1500A Semiconductor Device Analyzer has added benefits not found in the 4155C and 4156C.

Application Note 2005-03-31

PDF PDF 1.35 MB
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High Speed Parametric Test using Agilent 4070 series. AN4070-6
This application note describes practical know-how and techniques to improve the throughput of the Agilent 4070 series tester.

Application Note 2003-09-24

PDF PDF 168 KB
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Adapting Agilent 4070 series to open/short Measurement of YIELD TEST CHIP. AN4070-5
This application note describes the techniques required for adapting the Agilent 4070 series to quick yield ramp-up using Yield Test Chip testing.

Application Note 2003-09-05

PDF PDF 127 KB
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High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

PDF PDF 177 KB
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Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

PDF PDF 1.01 MB
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Tips for Reusing Existing 4142B Program for Agilent E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

Application Note 2003-05-10

PDF PDF 310 KB
Wafer Level Reliability Solution
The Agilent E5270A combines with the Agilent E5250A Low Leakage Switch Mainframe and Agilent E5255A Multiplexer Modules to form a complete wafer-level reliability (WLR) testing solution.

Application Note 2003-02-27

What is an SMU?
What is an SMU?

Application Note 2002-12-18

PDF PDF 19 KB
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?
How Do I Connect a Centronics (Parallel Port) Printer to My Agilent 4155A or Agilent 4156A?

Application Note 2002-12-18

HTML HTML 23 KB
What are the CV measurement capabilities of the 4140B, 4280A, and 4284A?
What are the CV measurement capabilities of the 4140B, 4280A, and 4284A?

Application Note 2002-12-18

HTML HTML 6 KB
How do I find my Agilent 4155A B or Agilent 4156A B firmware revision?
Click the following link for details.

Application Note 2002-12-18

PDF PDF 19 KB

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