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Parametric Test Systems

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Agilent's live webcasts
Stay up to date by bookmarking this page to see the latest information on Agilent's webcasts.

Webcast

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

New Power Device Measurement Solutions (1500 A / 10 kV)
Original broadcast June 19, 2012

Webcast - recorded

Parametric Test Basic Training Part 2
Originally broadcast Jan 19, 2011

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

SPECS User Training
Learn to quickly develop and run SPECS test plans to obtain semiconductor parametric information.

Classroom Training

Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar